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X-ray powder diffraction study of Sn0.59Ti0.41Te3O8

Published online by Cambridge University Press:  29 February 2012

W. Ben Aribia ,
M. Loukil ,
A. Kabadou  and
A. Ben Salah
W. Ben Aribia
Affiliation:
Laboratoire des Sciences des Matériaux et d’Environnement, Faculté des Sciences de Sfax, B.P. 802, 3018 Sfax, Tunisie
M. Loukil
Affiliation:
Laboratoire des Sciences des Matériaux et d’Environnement, Faculté des Sciences de Sfax, B.P. 802, 3018 Sfax, Tunisie
A. Kabadou
Affiliation:
Laboratoire des Sciences des Matériaux et d’Environnement, Faculté des Sciences de Sfax, B.P. 802, 3018 Sfax, Tunisie
A. Ben Salah
Affiliation:
Laboratoire des Sciences des Matériaux et d’Environnement, Faculté des Sciences de Sfax, B.P. 802, 3018 Sfax, Tunisie
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Abstract

The crystal structure of titanium-tin tellurium oxide Sn0.59Ti0.41Te3O8 has been determined using X-ray powder diffraction techniques. At room temperature, the title compound crystallizes in cubic space group Ia-3, with lattice parameter a=11.05515(6) Å. Rietveld refinement of the structure led to final confidence factors Rp=0.0395 and Rwp=0.0577. The structure of Sn0.59Ti0.41Te3O8 consists of isolated Ti/SnO6-octahedra slightly deformed in the a direction. The TeO4E [E=lone pair of Te(IV) atoms] groups are located between the octahedra ensuring the stability of the structure by Ti/Sn-O-Te bonding contacts. Only one peak in thermal behavior was detected for this compound at 488 K by differential scanning calorimetry experiment. An IR spectroscopic study is employed as a means to obtain preliminary structural information and shows the presence of the Ti/SnO6 and TeO4E groups. This result is later confirmed by X-ray diffraction studies.

Keywords

DSCrietveld refinementtellurium oxideIR spectroscopy
Type
TECHNICAL ARTICLES
Information
Powder Diffraction , Volume 23 , Issue 3 , September 2008 , pp. 228 - 231
Copyright
Copyright © Cambridge University Press 2008

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References

Arnaudov, M., Dimitriev, Y., Dimitrov, V., Dimitrova-Pankova, M., and Petkov, C. H. (1989). “IR-spectral investigation of glasses of the TeO2-GeO2 system,” Mater. Chem. Phys. MCHPDR 21, 215–222.CrossRefGoogle Scholar
Blanchandin, S., Champarnaud-Mesjard, J. C., Thomas, P., and Frit, B. (2000). “Crystal structure of BiNbTe2O8,” Solid State Sci. SSSCFJ 2, 223–228.CrossRefGoogle Scholar
Charton, P., Thomas, P., and Armand, P. (2003). “Raman and crystallization behaviors of TeO2-Sb2O4 glasses,” J. Non-Cryst. Solids JNCSBJ 321, 81–88.CrossRefGoogle Scholar
Gospodinov, G. G. (1985). “Possible tellurites in the three-component system Sn-Te-O and their thermal stability,” Thermochim. Acta THACAS 91, 351–355.CrossRefGoogle Scholar
Meunier, G. and Galy, J. (1971). “Sur une déformation inédite du reseau de type fluorine. Structure cristalline des phases MTe3O8 (M=Ti, Sn, Hf, Zr),” Acta Crystallogr., Sect. B: Struct. Crystallogr. Cryst. Chem. ACBCAR 27, 602–608.CrossRefGoogle Scholar
Rietveld, H. M. (1969). “A profile refinement method for nuclear and magnetic structures,” J. Appl. Crystallogr. JACGAR 10.1107/S0021889869006558 2, 65–71.CrossRefGoogle Scholar
Rodríguez-Carvajal, J. (1990). “FullProf: A program for rietveld refinement and pattern matching analysis,” Satellite Meeting on Powder Diffraction of the XV Congress of the IUCr, Toulouse, France, p. 127.Google Scholar
Roisnel, T. and Rodríguez-Carvajal, J. (2001). “WinPLOTR: A windows tool for powder diffraction pattern analysis,” Mater. Sci. Forum MSFOEP 378–381, 118–123.CrossRefGoogle Scholar
Vivekanandan, K., Selvasekarapandian, S., Kolandaivel, P., Sebastian, M. T., and Suma, S. (1997). “Raman and FT-IR spectroscopic characterisation of flux grown KTiOPO4 and KRbTiOPO4 non-linear optical crystals,” Mater. Chem. Phys. MCHPDR 10.1016/S0254-0584(97)80165-4 49, 204–210.CrossRefGoogle Scholar
Yamaguchi, O., Ohtagaki, T., and Shimizu, K. (1988). “Formation of a continuous series of solid solutions in the system TiTe3O8-ZrTe3O8,” Z. Anorg. Allg. Chem. ZAACAB 564, 115–120.CrossRefGoogle Scholar
Young, R. A. and Wiles, D. B. (1982). “Profile shape functions in Rietveld refinements,” J. Appl. Crystallogr. JACGAR 10.1107/S002188988201231X 15, 430–438.CrossRefGoogle Scholar