Hostname: page-component-586b7cd67f-t7czq Total loading time: 0 Render date: 2024-11-23T07:01:56.775Z Has data issue: false hasContentIssue false
  • English
  • Français

X-ray powder diffraction data for the Al3Ho2Si2 ternary compound

Published online by Cambridge University Press:  17 June 2013

Zhao Lu ,
Ming Qin ,
Liuqing Liang ,
Shuhui Liu ,
Caiming Huang ,
Peiling Qing  and
Lingmin Zeng
Zhao Lu
Affiliation:
Department of physics and communication engineering, Baise University, Baise, Guangxi 533000, China
Ming Qin*
Affiliation:
Department of physics and communication engineering, Baise University, Baise, Guangxi 533000, China
Liuqing Liang
Affiliation:
Department of physics and communication engineering, Baise University, Baise, Guangxi 533000, China
Shuhui Liu
Affiliation:
Department of physics and communication engineering, Baise University, Baise, Guangxi 533000, China
Caiming Huang
Affiliation:
Department of physics and communication engineering, Baise University, Baise, Guangxi 533000, China
Peiling Qing
Affiliation:
Department of physics and communication engineering, Baise University, Baise, Guangxi 533000, China
Lingmin Zeng
Affiliation:
Institute of Materials Science, Guangxi University, Nanning, Guangxi 530004, China
*
a) Author to whom correspondence should be addressed. Electronic mail: [email protected]
Get access Rights & Permissions [Opens in a new window]

Abstract

Crystal and X-ray powder diffraction data are presented for the Al3Ho2Si2 ternary compound. The powder pattern was indexed and refined on a monoclinic cell with the Al3Y2Si2 structure type with space group C12/m1, a = 10.1096(2) Å, b = 4.020(6) Å, c = 6.5734(6) Å, β = 100.848(2)°, V = 262.37 Å3, Z = 2ρx = 5.910 g cm−3, F30 = 142.8(0.006, 35), and RIR = 0.91.

Keywords

Al3Ho2Si2powder X-ray diffraction
Type
New Diffraction Data
Information
Powder Diffraction , Volume 28 , Issue 4 , December 2013 , pp. 299 - 301
Copyright
Copyright © International Centre for Diffraction Data 2013 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Bobev, S., Tobash, P. H., Fritsch, V., Thompson, J. D., Hundley, M. F., Sarrao, J. L., and Fisk, Z. (2005). “Ternary rare-earth alumo-silicides–single-crystal growth from Al flux, structural and physical properties,” J. Solid State Chem. 178, 2091–2103.Google Scholar
Chen, X.-Z., Sieve, B., Henning, R., Schultz, A. J., Brazis, P., Kannewurf, C. R., Cowen, J. A., Crosby, R., and Kanatzidis, M. G. (1999). “Ln2Al3Si2 (Ln = Ho, Er, Tm): new silicides from molten aluminium – determination of the Al/Si distribution with neutron crystallography and metamagnetic transitions,” Angew. Chem. Int. ed. 38, 693–696.Google Scholar
ICDD (2011). “PDF-2 2011 (Database)”, edited by Kabekkodu, S. (International Centre for Diffraction Data, Newtown Square, PA, USA).Google Scholar
JADE Version 6.0 (2002). “XRD pattern processing,” Materials Data Inc., Livermore, CA.Google Scholar
Smith, G. S. and Snyder, R. L. (1979). “ F N: a criterion for rating powder diffraction patterns and evaluating the reliability of powder pattern indexing,” J. Appl. Cryst. 12, 60.CrossRefGoogle Scholar
Szytuda, A. and Leciejewicz, J. (1994). in CRC Handbook of Crystal Structures and Magnetic Properties of Rare Earth Intermetallics (CRC Press, Boca Raton, FL), p. 110.Google Scholar