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X-ray powder diffraction data and structure refinement of CeFeGe3

Published online by Cambridge University Press:  10 January 2013

Jialin Yan ,
Shiwei Wu ,
Xiangli Ou ,
Lingmin Zeng  and
Jianmin Hao
Jialin Yan
Affiliation:
Institute of Materials Science, Guangxi University, Nanning, 530004, P. R. China
Shiwei Wu
Affiliation:
Institute of Materials Science, Guangxi University, Nanning, 530004, P. R. China
Xiangli Ou
Affiliation:
Institute of Materials Science, Guangxi University, Nanning, 530004, P. R. China
Lingmin Zeng
Affiliation:
Institute of Materials Science, Guangxi University, Nanning, 530004, P. R. China
Jianmin Hao
Affiliation:
Tianjin Electronic Materials Research Institute, Tianjin, 300192, P. R. China
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Abstract

The crystal structure of the rare earth (RE) compound CeFeGe3 has been studied by X-ray powder diffraction and refined by the Rietveld profile fitting method. The compound has the tetragonal BaNiSn3-type structure, space group I4mm (No. 107) a=4.3294(1) Å, c=9.9444(3) Å, V=186.39 Å3, Z=2, and Dx=7.372 g·cm−3. The figure of merit FN for the powder data is F30=184.3(0.0037,44). The structure refinement was performed with 106 reflections and led to Rp=13.2% and Rwp=18.2%. Powder data are given.

Type
Research Article
Information
Powder Diffraction , Volume 13 , Issue 4 , December 1998 , pp. 241 - 243
Copyright
Copyright © Cambridge University Press 1998

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References

International Tables for X-ray Crystallography. (1974). Vol. IV, Birmingham: Kynoch Press.Google Scholar
Rietvald, H. M.(1967).Acta Crystallogr. 22, 151–152. Rietvald, H. M. (1969). J. Appl. Crystallogr. 2, 65–71.CrossRefGoogle Scholar
Sakthivel, A., and Young, R. A. (1991). User's Guide to Programs DBWS-9006 and DBWS-9006PC, School of Physics, Georgia, Institute of Technology, Atlanta, GA 30332.Google Scholar
Salamakha, P., Konyk, M., Sologub, O., and Bodak, O. (1996).J. Alloys Compd. 234, 151–156.CrossRefGoogle Scholar
Schreiner, W. N. (1994). Guidelines for Grant-in-Aid proposals, Appendix 5, International Centre for Diffraction Data, Newtown Square, Pennsylvania.Google Scholar
Smith, G. S., and Snyder, R. L. (1979).J. Appl. Crystallogr. 12, 60–65.CrossRefGoogle Scholar
Werner, P. E. (1964).Z. Kristallogr. 120, 375–387.CrossRefGoogle Scholar
Venturini, G., Meot Meyer, M., Malaman, B., and Roques, B. (1985).J. Less-Common Met. 113, 197–204.CrossRefGoogle Scholar