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X-ray powder diffraction data and structural study of Fe2GeSe4

Published online by Cambridge University Press:  10 January 2013

J. A. Henao ,
J. M. Delgado  and
M. Quintero
J. A. Henao
Affiliation:
Departamento de Química, Facultad de Ciencias, Universidad de los Andes, Apdo. 40, La Hechicera, Mérida 5251, Venezuela
J. M. Delgado*
Affiliation:
Departamento de Química, Facultad de Ciencias, Universidad de los Andes, Apdo. 40, La Hechicera, Mérida 5251, Venezuela
M. Quintero
Affiliation:
Departamento de Física, Facultad de Ciencias, Universidad de los Andes, Mérida 5101, Venezuela
*
a)To whom correspondence should be addressed.
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Abstract

The room temperature X-ray powder diffraction pattern of Fe2GeSe4, a II2 □ IV VI4 semiconducting compound, has been recorded and evaluated. This material was found to be orthorhombic, a=13.069(1), b=7.559(1), c=6.2037(6) Å, V=612.83(9) Å3, Z=4, Dx=5.42 gcm−3. The structure refinement carried out using the Rietveld method indicated that this material crystallizes in space group Pnma (No. 62) with an olivine type of structure. The refinement of 33 parameters led to RWP=15.3%, RP=10.2% for 5251 step intensities and RB=9.44% and RF=9.36% for 913 reflections.

Keywords

Powder diffractionRietveld analysissemiconductor compounds
Type
Research Article
Information
Powder Diffraction , Volume 13 , Issue 4 , December 1998 , pp. 196 - 201
Copyright
Copyright © Cambridge University Press 1998

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