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X-Ray Powder Data for α-Si3N4

Published online by Cambridge University Press:  10 January 2013

D. A. Norris ,
M. A. Rodriguez ,
S. K. Fukuda  and
R. L. Snyder
D. A. Norris
Affiliation:
New York State College of Ceramics at Alfred University, Alfred, NY 14802-1296, U.S.A.
M. A. Rodriguez
Affiliation:
New York State College of Ceramics at Alfred University, Alfred, NY 14802-1296, U.S.A.
S. K. Fukuda
Affiliation:
New York State College of Ceramics at Alfred University, Alfred, NY 14802-1296, U.S.A.
R. L. Snyder
Affiliation:
New York State College of Ceramics at Alfred University, Alfred, NY 14802-1296, U.S.A.
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Abstract

A new X-ray powder diffraction pattern for α-Si3N4is presented and compared with the current PDF pattern. The necessity for an updated pattern is discussed.

Type
Research Article
Information
Powder Diffraction , Volume 5 , Issue 4 , December 1990 , pp. 225 - 226
Copyright
Copyright © Cambridge University Press 1990

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References

Hahn, T.(1983). International Tables for X-Ray Crystallography. Dordrecht, Holland: Vol. A., D. Reidel Publishing Co.Google Scholar
Hubbard, C.R.(1973). Modification of Appleman least squares, Appleman, D.E.and Evans, H.T. Jr., Indexing and Least-Squares of Powder Diffraction Data, Report PB216188. U.S. Dept. of Commerce, National Technical Information Service, 5285 Port Royal Rd., Springfield, VA22151.Google Scholar
Kohatsu, I.and McCauley, J.W.(1974). Re-Examination of the Crystal Structure of α-Si3N4. Mat. Res. Bull. 917–920.Google Scholar
Peuckert, M.and Greil, P.(1987). Oxygen Distribution in Silicon Nitride Powders. J. Mater. Sci. 22, 3717–3720.CrossRefGoogle Scholar
Segal, D.L.(1986). A Review of Preparative Routes to Silicon Nitride Br. Ceram. Trans. J. 85, 185–187.Google Scholar
Smith, G.S.and Snyder, R.L.(1979). FN: A Criterion for Relating Powder Diffraction Patterns and Evaluating the Reliability of Powder Pattern Indexing. J. Appl. Cryslallog. 12, 60–65.CrossRefGoogle Scholar