Hostname: page-component-586b7cd67f-2plfb Total loading time: 0 Render date: 2024-11-26T23:03:45.592Z Has data issue: false hasContentIssue false
  • English
  • Français

Texture-tuned growth of CdTe thin films by closed-space sublimation technique

Published online by Cambridge University Press:  29 February 2012

Shang Fei ,
Ji-kang Jian ,
Wu Rong ,
Zheng Yu-feng  and
Sun Yan-fei
Shang Fei
Affiliation:
College of Physical Science and Technology, Xinjiang University, Urumqi, Xinjiang 830046, China
Ji-kang Jian
Affiliation:
College of Physical Science and Technology, Xinjiang University, Urumqi, Xinjiang 830046, China
Wu Rong
Affiliation:
College of Physical Science and Technology, Xinjiang University, Urumqi, Xinjiang 830046, China
Zheng Yu-feng
Affiliation:
College of Physical Science and Technology, Xinjiang University, Urumqi, Xinjiang 830046, China
Sun Yan-fei
Affiliation:
College of Physical Science and Technology, Xinjiang University, Urumqi, Xinjiang 830046, China
Get access Rights & Permissions [Opens in a new window]

Abstract

CdTe thin films were grown on indium tin oxide glass substrates by a closed-space sublimation method using a resistor heater. Crystalline structure, morphology, and band gaps of the films were characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM), and optical absorption, respectively. The XRD analysis showed that the textures of the films were found to depend on the rate of increase in the heating current. The CdTe thin film had an (111) texture when the heating current rate was 2.0 A/min. The SEM analysis revealed that the film is composed of polyhedral grains of microns size. However, the (111) texture of the CdTe thin film observed by XRD decreased with the appearance of (220), (311), (400), (331), (422), and (511) peaks of the fcc CdTe phase when the heating current rate increased to 4.5 A/min. The (111) texture disappeared when the heating current was increased immediately from 0 A to the target current of 70 A. SEM results revealed that the grains in the film are round and the grain size is smaller than 1 μm. Optical absorption analysis showed that there is no distinctive difference in the band gaps of the films.

Keywords

CSSresistor heaterpreferred orientation
Type
Technical Articles
Information
Powder Diffraction , Volume 23 , Issue 1 , March 2008 , pp. 31 - 34
Copyright
Copyright © Cambridge University Press 2008

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Alamri, S. N. (2003). “The Growth of CdTe Thin Film by Close Space Sublimation System,” Phys. Status Solidi A PSSABA 200, 352–360.CrossRefGoogle Scholar
El–Kadry, N., Ahmed, M. F., and Hady, K. A. (1996). “Effect of Deposition Parameters on the Optical Absorption in Thermally Evaporated Cadmium Telluride Thin Films,” Thin Solid Films THSFAP 274, 120–127.CrossRefGoogle Scholar
Ham, S., Choi, B., Myung, N., de Tacconi, N. R., Chenthamarakshan, C. R., Rajeshwar, K., and Son, Y. (2007). “Electrodeposition of CdTe Thin Films on Te-Modified Polycrystalline Gold Substrates,” J. Electroanal. Chem. JECHES 601, 77–82.CrossRefGoogle Scholar
Harris, G. B. (1952). “Quantitative Measurement of Preferred Orientation in Rolled Uranium Bars,” Philos. Mag. PHMAA4 43, 113–123.CrossRefGoogle Scholar
Harsdorff, M. (1982). “Heterogeneous Nucleation and Growth of Thin Films,” Thin Solid Films THSFAP 10.1016/0040-6090(82)90061-X 90, 1–14.CrossRefGoogle Scholar
ICDD (2003). “Powder diffraction file,” International Centre for Diffraction Data, edited by McClune, W. F., 12 Campus Boulevard, Newtown Square, PA, 19073–3272.Google Scholar
Kim, K. H. and Chun, J. S. (1986). “X-ray Studies of SnO2 Prepared by Chemical Vapour Deposition,” Thin Solid Films THSFAP 10.1016/0040-6090(86)90356-1 141, 287–295.CrossRefGoogle Scholar
Lalitha, S., Karazhanov, S. Z., Ravindran, P., Senthilarasu, S., Sathyamoorthy, R., and Janabergenov, J. (2007). “Electronic Structure, Structural and Optical Properties of Thermally Evaporated CdTe Thin Films,” Physica B PHYBE3 10.1016/j.physb.2006.04.008 387, 227–238.CrossRefGoogle Scholar
Major, J. D., Proskuryakov, Y. Y., Durose, K., and Green, S. (2007). “Nucleation of CdTe Thin Films Deposited by Close-Space Sublimation Under a Nitrogen Ambient,” Thin Solid Films THSFAP 515, 5828–5832.CrossRefGoogle Scholar
Matsune, K., Oda, H., Toyama, T., Okamoto, H., Kudriavysevand, Y., and Asomoza, R. (2006). “15% Efficiency CdS/CdTe Thin Film Solar Cells Using CdS Layers Doped With Metal Organic Compounds,” Sol. Energy Mater. Sol. Cells SEMCEQ 90, 3108–3114.CrossRefGoogle Scholar
Mendoza–Alvarez, J. G., González–Hernández, J., Sánchez–Sinencio, F., Zelaya, O., and Chao, S. S. (1990). “Luminescence and Particle Size in Microcrystalline CdTe Thin Films,” J. Cryst. Growth JCRGAE 86, 391–395.CrossRefGoogle Scholar
Myers, T. H., Edwards, S. W., and Schetzina, J. F. (1981). “Optical Properties of Polycrystalline CdTe Films,” J. Appl. Phys. JAPIAU 10.1063/1.329272 52, 4231–4237.CrossRefGoogle Scholar
Quiñones, S. A., Ammu, S. M., Escobedo, A., Rodriguez, M., Cruz–Campa, J., McClure, J., and Zubia, D. (2007). “SEM Characterization of CdTe Growth on CdTe (111) by Close-Spaced Sublimation,” J. Mater. Sci.: Mater. Electron. JSMEEV 10.1007/s10854-007-9211-y 18, 1085–1091.Google Scholar
Ramachandran, V. and Vaya, P. R. (1983). “Computer-Aided Study of Hot Wall Epitaxy System Using a Monte-Carlo Technique,” J. Appl. Phys. JAPIAU 10.1063/1.332718 54, 5385–5393.CrossRefGoogle Scholar
Rusu, M., Nicoaescu, I. I., and Rusu, G. G. (2000). “Influence of Deposition Conditions on the Structural Characteristics of Sublimated CdTe Thin Films,” Appl. Phys. A APAMFC 70, 565–571.CrossRefGoogle Scholar
Saha, S., Pal, U., SamantaRay, B. K., and Chaudhuri, A. K. (1990). “Effect of Preferred Orientation on Photovoltage of CdTe Thin Films,” Solid State Commun. SSCOA4 74, 839–841.CrossRefGoogle Scholar
Santana–Aranda, M. A. and Meléndez–Lira, M. (2001). “Screen Printed CdsxTe1−x Films, Structural and Optical Characterization,” Appl. Surf. Sci. ASUSEE 175–176, 538–542.CrossRefGoogle Scholar
Saucedo, E., Corregidor, V., Fornaro, L., Cuña, A., and Dieguez, E. (2005). “CdTe Polycrystalline Films for X-Ray Digital Imaging Applications,” Thin Solid Films THSFAP 471, 304–309.CrossRefGoogle Scholar
Shah, N. A., Ali, A., Aqili, A. K. S., and Maqsood, A. (2006). “Physical Properties of Ag-Doped Cadmium Telluride Thin Films Fabricated by Closed-Space Sublimation Technique,” J. Cryst. Growth JCRGAE 290, 452–458.CrossRefGoogle Scholar
Sirohi, S., Kumar, V., and Sharma, T. P. (1999). “Optical, Structural and Electrical Properties of CdTe Sintered Films,” Opt. Mater. OMATET 12, 121–125.CrossRefGoogle Scholar
Sitter, H. and Schikora, D. (1984). “Investigations of the Initial Stage of the Epitaxial Growth of CdTe Layers,” Thin Solid Films THSFAP 10.1016/0040-6090(84)90414-0 116, 137–142.CrossRefGoogle Scholar
Vigil-Galán, O., Sastré-Hernández, J., Cruz-Gandarilla, F., Aguilar-Hernández, J., Marín, E., Contreras-Puente, G., Saucedo, E., Ruiz, C. M., Bermúdez, V., and Tufiño-Velázquez, M. (2006). “Physical Properties of Bi Doped CdTe Thin Films Grown by the CSVT Method,” Sol. Energy Mater. Sol. Cells SEMCEQ 90, 2228–2234.CrossRefGoogle Scholar