Hostname: page-component-586b7cd67f-r5fsc Total loading time: 0 Render date: 2024-11-29T12:18:58.483Z Has data issue: false hasContentIssue false
  • English
  • Français

Structure of the M2CuWO6 System, with M = Ba or Sr

Published online by Cambridge University Press:  10 January 2013

Bokhimi
Bokhimi
Affiliation:
Institute de Fisica, UNAM, a.p. 20-364, 01000 México D. F., Mexico
Get access Rights & Permissions [Opens in a new window]

Abstract

The crystalline structure of the M2CuWO6 phases with M = Ba or Sr was obtained from X-ray powder diffraction at room temperature with CuKα radiation. The phases are isostructural with tetragonal unit cells, space group I4/m and Z = 2. The parameters for the Sr2CuWO6 phase are: Mr = 518.6, a = 5.42693(5) Å, c = 8.4087(1) Å, V = 247.65(1) Å3, Dx = 6.954 Mg/m3, μ = 77.75 mm−1, F(000) = 454, R = 0.0375 for 24 reflections; the parameters for the Ba2CuWO6 phase are: Mr = 618.1, a = 5.56392(8) Å, c = 8.6274(1) Å, V = 267.08(1) Å3, Dx = 7.683 Mg/m3, μ = 157.0 mm−1, F(000) = 526, R = 0.0506 for 27 reflections. Cell parameters were obtained from Rietveld refinement. The crystalline structure is based on the perovskite structure. It is laminar with ordered alternating WO6 deformed octahedra and CuO2 planar squares along the [110] direction, joined by corners and rotated perpendicular to the [001] direction. The samples are electrica insulators.

Type
Research Article
Information
Powder Diffraction , Volume 7 , Issue 4 , December 1992 , pp. 228 - 230
Copyright
Copyright © Cambridge University Press 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Blasse, G. (1965). J. Inorg. Nucl. Chem. 27, 993–1003.CrossRefGoogle Scholar
Bokhimi, , (1991). Physica C 175, 119–126.CrossRefGoogle Scholar
García-Ruiz, A, Bokhimi, , & Portilla, M. (1992). J. Mater. Res. 7, 24–28.CrossRefGoogle Scholar
International Tables for X-ray Crystallography (1974). Bd. IV. Kynoch Press, Birmingham.Google Scholar
Kapyshev, A. G., Ivanova, V. V. & Venevtsev, Yu. N. (1966). Sov. Phys. Doklady 11, 195–196.Google Scholar
Mattheis, L. R., Gyorgy, E. M. & Johnson, D. W. Jr., (1988). Phys. Rev. B 37, 3745–3746.CrossRefGoogle Scholar
Sato, M., Grier, B. H., Fujishita, H., Hoshino, S. & Moodenbaugh, A. R. (1983). J. Phys. C 16, 5217–5232.Google Scholar
Schneider, J. (1989). International Workshop on the Rietveld Method, Petten, The Netherlands.Google Scholar
Wong-Ng, W., McMurdie, H., Paretzkin, B., Hubbard, C. & Dragoo, A. (1987). Pow. Diff. 3, 47–50. [PDF 38-1375 and 38-1378].CrossRefGoogle Scholar
Young, R. A. (1990). Preprint, Third International School and Workshop of Crystallography on X-ray Powder Diffraction and Its Applications, Cairo Egypt, January 14-23.Google Scholar
Won, K. & Francois, M. (1989), Z. Phys. B 76, 413–444.Google Scholar