I. INTRODUCTION
In the Al–Ni–Sc ternary system, the crystal structure and X-ray powder diffraction (PXRD) data of five ternary compounds, AlNiSc (Teslyuk and Protasov, Reference Teslyuk and Protasov1965), Al16Ni7Sc6 (Markiv and Burnasheva, Reference Markiv and Burnasheva1969), AlNi2Sc (Dwight and Kimball, Reference Dwight and Kimball1987), Al2NiSc (Gladyshevskii and Parthe, Reference Gladyshevskii and Parthe1992), and Al0.902Ni1.098Sc (Sahlberg et al., Reference Sahlberg, Angstroem, Zlotea, Beran, Latroche and Paygomez2012), have been studied and collected in the Inorganic Crystal Structure Database (ICSD) and ICDD's Powder Diffraction File. Recently, our team has studied phase relations of the Al–Ni–Sc ternary system (He et al., Reference He, Fan, Liu, Peng and Jin2019) and detected four new phases Ni2Al5Sc, Ni2Al4Sc, NiAl2Sc3, and NiAlSc5. The actual composition of the detected phase NiAlSc5 is determined to be Al0.931Ni1.069Sc5 after studied. However, information for the crystal structure of Al0.931Ni1.069Sc5 is not available in the literature. Here, the PXRD data for Al0.931Ni1.069Sc5 is reported.
II. EXPERIMENTAL
A. Sample preparation
The sample of Al0.931Ni1.069Sc5 was prepared by arc melting the stoichiometric amounts of elemental constituents 99.99 Al, 99.99 Ni, and 99.9 Sc (wt%) (supplied by China New Metal Materials Technology Co., Ltd.) under high purity argon atmosphere on a water-cooled copper hearth. To ensure homogeneity of the sample, it was melted four times and weight losses were less than 1 wt%. After melting, the sample was enclosed in an evacuated quartz tube and annealed at 1173 K for 40 days, and then finally cooled down to room temperature at a rate of 10 K/h. The composition (13.40 at.% Al, 15.32 at.% Ni, 71.28 at.% Sc) of the sample was obtained by the electron probe microanalysis (EPMA; JXA-8800R, JEOL, Japan), which is in good agreement with the crystal structure refinement composition of Al0.931Ni1.069Sc5 (13.30 at.% Al, 15.27 at.% Ni, 71.43 at.% Sc). The sample was then grounded to a size smaller than 20 μm for powder diffraction analysis.
B. Data collection
A PXRD pattern (Figure 1) of the new compound Al0.931Ni1.069Sc5 was obtained using a Rigaku D/max 2550 V X-ray diffractometer equipped with CuKα radiation and a graphite monochromator. The 2θ scan range was from 10.02° to 100.04° with a step size of 0.02° and a count time of 1 s/step. The lattice parameters were calculated with the XRD pattern processing program JADE 6.0 (Materials Data Inc., 2002).
III. RESULTS AND DISCUSSION
The PXRD pattern of Al0.931Ni1.069Sc5 was indexed using the JADE 6.0 program after smoothing the patterns, fitting the background, and stripping the CuKα 2 peaks. All lines were successfully indexed in the hexagonal system with the lattice parameters a = 8.8287(3) Å, c = 8.6959(4) Å, and the Al5Co2 (Burkhardt et al., Reference Burkhardt, Ellner, Grin and Baumgartner1998) structure type. Details of the crystal structure for Al0.931Ni1.069Sc5 will be given in our further publication. The observed X-ray powder diffraction data are listed in Table I.
IV. DEPOSITED DATA
The raw data file of Al0.931Ni1.069Sc5 has been deposited with ICDD. You may request this data from ICDD at [email protected].
FUNDING STATEMENT
This work was financially supported by the National Key Research and Development Program of China (Grant No. 2016YFB0701404).