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Microdiffraction using two-dimensional detectors

Published online by Cambridge University Press:  06 March 2012

Bob Baoping He
Bob Baoping He*
Affiliation:
Bruker AXS Inc., 5465 East Cheryl Parkway Madison, Wisconsin 53711
*
a)Author to whom correspondence should be addressed; Electronic mail: [email protected]
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Abstract

X-ray diffraction analysis on small samples or micro-area of large samples is always a challenge due to weak diffraction and poor statistics, especially when dealing with samples containing large grain size, inhomogeneous phase distribution, and preferred orientation. Two-dimensional X-ray diffraction has many advantages in microdiffraction analysis. A two-dimensional detector can collect a large amount of data both in terms of speed and angular coverage. This paper covers some aspects about instrumentation of two-dimensional X-ray diffraction and its applications in phase identification and stress analysis on small samples and micro-area of large samples.

Type
Special Section on Microanalysis
Information
Powder Diffraction , Volume 19 , Issue 2 , June 2004 , pp. 110 - 118
Copyright
Copyright © Cambridge University Press 2004

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