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Long term stability of a modern powder diffractometer

Published online by Cambridge University Press:  05 March 2012

Markus Wunschel ,
Robert E. Dinnebier  and
Sander van Smaalen
Markus Wunschel
Affiliation:
Laboratory of Crystallography, University of Bayreuth, D-95440 Bayreuth, Germany
Robert E. Dinnebier
Affiliation:
Laboratory of Crystallography, University of Bayreuth, D-95440 Bayreuth, Germany
Sander van Smaalen
Affiliation:
Laboratory of Crystallography, University of Bayreuth, D-95440 Bayreuth, Germany
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Abstract

The characteristics of the (101) peak of α-quartz and the (104) peak of the NIST SRM 1976 alumina flat plate standard have been measured in dependence of time for 60 h with Cu-Kα1 radiation in Bragg-Brentano geometry with a Philips X’Pert diffractometer equipped with a primary Ge(111) monochromator. It was found that the reproducibility of the peak position and the peak shape falls well in the ±3σ range, whereas the peak intensity strongly depends on the power history of the X-ray generator and the temperature of the diffraction system. The effects on Rietveld refinements are discussed and recommendations are given for optimized data collection.

Type
Technical Articles
Information
Powder Diffraction , Volume 16 , Issue 3 , September 2001 , pp. 149 - 152
Copyright
Copyright © Cambridge University Press 2001

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