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Improved bench-top X-ray diffractometer for crystalline phase analysis of cement

Published online by Cambridge University Press:  07 November 2013

Atsushi Ohbuchi ,
Takayuki Konya  and
Go Fujinawa
Atsushi Ohbuchi*
Affiliation:
Application Laboratories, Rigaku Corporation, 3-9-12, Matsubara-cho, Akishima-shi Tokyo, Japan
Takayuki Konya
Affiliation:
Application Laboratories, Rigaku Corporation, 3-9-12, Matsubara-cho, Akishima-shi Tokyo, Japan
Go Fujinawa
Affiliation:
Application Laboratories, Rigaku Corporation, 3-9-12, Matsubara-cho, Akishima-shi Tokyo, Japan
*
a) Author to whom correspondence should be addressed. Electronic mail: [email protected]
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Abstract

A laboratory-scale X-ray diffractometer for obtaining high X-ray intensity data was developed. The apparatus, equipped with 600 W CuKα radiation with a Ni filter, incorporates technology that dramatically improves the quality of X-ray diffraction. The system comprises of a low-noise one-dimensional silicon strip detector, a variable slit, and a goniometer with a radius as small as 150 mm. A variable knife edge was used as a countermeasure for unwanted scattering, particularly in the low angle range. With this system, cement may be analyzed within 5 min. NIST 2686 standard reference material was analyzed using the newly developed diffractometer, and the quantitative analysis results for the major phases are in agreement with the certified values of the reference material.

Keywords

Bench-top X-ray diffractometercementRietveld refinementcalcification process
Type
Technical Articles
Information
Powder Diffraction , Volume 28 , Issue 4 , December 2013 , pp. 249 - 253
Copyright
Copyright © International Centre for Diffraction Data 2013 

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