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Development of a quantification method for quartz in various bulk materials by X-ray diffraction and the Rietveld method

Published online by Cambridge University Press:  03 April 2012

Joannie Martin*
Affiliation:
Département de Chimie, Université du Québec à Montréal, 2101, avenue Jeanne-Mance, Montréal, Québec H2X 2J6, Canada
Martin Beauparlant
Affiliation:
Institut de recherche Robert-Sauvé en santé et en sécurité du travail (IRSST)505, boul. De Maisonneuve Ouest, Montréal, Québec H3A 3C2, Canada
Jacques Lesage
Affiliation:
Institut de recherche Robert-Sauvé en santé et en sécurité du travail (IRSST)505, boul. De Maisonneuve Ouest, Montréal, Québec H3A 3C2, Canada
Huu Van Tra
Affiliation:
Département de Chimie, Université du Québec à Montréal, 2101, avenue Jeanne-Mance, Montréal, Québec H2X 2J6, Canada
*
a)Author to whom correspondence should be addressed. Electronic mail: [email protected]

Abstract

Crystalline silica is known for its health hazards, and since 1997 has been listed as Group 1, Carcinogenic to Humans, by the International Agency for Research on Cancer. This issue is particularly important in the industrial environment, and there is still no method that allows quantification of the different polymorphs of crystalline silica. Many analytical methods have been proposed, and the major problem in almost all cases is attributable to the very large variety of matrixes encountered. This study evaluates the potential of X-ray diffraction techniques and an automated Rietveld analysis in order to overcome this problem and to adapt the quantitative analysis of quartz, the most prevalent crystalline silica polymorph, to routine analysis in the health and safety environment. Matrix simulations are done and many parameters are optimized. Sample preparation, the acquisition program, pattern treatment, and Rietveld refinement are evaluated, and a general procedure is determined. Automation of Rietveld refinement leads to a significant reduction in analysis time, but cannot be applied to every type of sample.

Type
Technical Articles
Copyright
Copyright © International Centre for Diffraction Data 2012

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