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D023 Residual stresses in thin films characterized by the combination of SIN2Ψ and curvate methods: possibilities and limitations

Published online by Cambridge University Press:  20 May 2016

J. Keckes ,
K. J. Martinschitz  and
E. Eiper
J. Keckes
Affiliation:
Erich Schmid Institute, Leoben, Austria
K. J. Martinschitz
Affiliation:
Erich Schmid Institute, Leoben, Austria
E. Eiper
Affiliation:
Erich Schmid Institute, Leoben, Austria
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Abstract

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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 21 , Issue 2 , June 2006 , pp. 184
Copyright
Copyright © Cambridge University Press 2006

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