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Crystal structures and reference diffraction patterns of BaSrR4O8

Published online by Cambridge University Press:  05 March 2012

W. Wong-Ng ,
J. A. Kaduk  and
J. Dillingham
W. Wong-Ng*
Affiliation:
Ceramics Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899
J. A. Kaduk
Affiliation:
BP Amoco Chemicals, Naperville, Illinois 60566
J. Dillingham
Affiliation:
Geology Department, University of Maryland, College Park, Maryland 20742
*
a)Electronic mail: [email protected]
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Abstract

The structure of BaSrR4O8 (where R=La, Nd, Sm, Gd, Eu, Dy, Ho, Y, Er, Tm, Yb, and Lu) has been investigated, and the X-ray reference patterns of these compounds have been prepared using the Rietveld refinement technique. BaSrR2O4 are isostructural to BaR2O4, which have the CaFe2O4 structure type (orthorhombic, Pnam). The cell parameters of these compounds (R=Lu to La) range from 10.125 04(10) to 10.5501(8) Å for a, 3.362 49(3) to 3.692 04(24) Å for b, 11.846 91(13) to 12.5663(9) Å for c, and 403.33 to 489.47 Å3 for V, respectively. There is a linear relationship between V and the Shannon ionic radius of R. Unlike the BaR2O4 compositions (R=Tm, Lu, and Yb), which produced a mixture of Ba3R4O9 and unreacted lanthanide oxides, single-phase BaSrTm4O8, BaSrLu4O8, and BaSrYb4O8 were successfully prepared.

Type
Technical Articles
Information
Powder Diffraction , Volume 17 , Issue 3 , September 2002 , pp. 202 - 209
Copyright
Copyright © Cambridge University Press 2002

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