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Calibration of X-ray imaging devices for accurate intensity measurement

Published online by Cambridge University Press:  15 June 2012

Michael J. Haugh ,
Michael R. Charest ,
Patrick W. Ross ,
Joshua J. Lee ,
Marilyn B. Schneider ,
Nathan E. Palmer  and
Alan T. Teruya
Michael J. Haugh*
Affiliation:
National Security Technologies, LLC, 161 S. Vasco Rd. Suite A, Livermore, California94550
Michael R. Charest
Affiliation:
National Security Technologies, LLC, 161 S. Vasco Rd. Suite A, Livermore, California94550
Patrick W. Ross
Affiliation:
National Security Technologies, LLC, 161 S. Vasco Rd. Suite A, Livermore, California94550
Joshua J. Lee
Affiliation:
National Security Technologies, LLC, 161 S. Vasco Rd. Suite A, Livermore, California94550
Marilyn B. Schneider
Affiliation:
Lawrence Livermore National Laboratory, 7000 East Ave., Livermore, California94550
Nathan E. Palmer
Affiliation:
Lawrence Livermore National Laboratory, 7000 East Ave., Livermore, California94550
Alan T. Teruya
Affiliation:
Lawrence Livermore National Laboratory, 7000 East Ave., Livermore, California94550
*
a)Author to whom correspondence should be addressed. Electronic mail: [email protected]
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Abstract

National Security Technologies (NSTec) has developed calibration procedures for X-ray imaging systems. The X-ray sources that are used for calibration are both diode type and diode/fluorescer combinations. Calibrating the X-ray detectors is a key to accurate calibration of the X-ray sources. Both energy dispersive detectors and photodiodes measuring total flux were used. We have developed calibration techniques for the detectors using radioactive sources that are traceable to the National Institute of Standards and Technology (NIST). The German synchrotron at Physikalische Technische Bundestalt (PTB) was used to calibrate the silicon photodiodes over the energy range from 50 to 60 keV. The measurements on X-ray cameras made using the NSTec X-ray sources included quantum efficiency averaged over all pixels, camera counts per photon per pixel, and response variation across the sensor. The instrumentation required to accomplish the calibrations is described. The X-ray energies ranged from 720 to 22.7 keV. The X-ray sources produce narrow energy bands, allowing us to determine the properties as a function of X-ray energy. The calibrations were done for several types of imaging devices. There were back and front illuminated CCD (charge-coupled device) sensors, and a CID (charge injection device) type camera. The CCD and CID camera types differ significantly in some of their properties that affect the accuracy of the X-ray intensity measurements. All the cameras discussed here are silicon based. The measurements of the quantum efficiency variation with the X-ray energy are compared to the models for the sensor structure. The cameras that are not back-thinned are compared to those that are.

Keywords

X-ray imaging devicesintensity measurement
Type
Technical Articles
Information
Powder Diffraction , Volume 27 , Issue 2 , June 2012 , pp. 79 - 86
Copyright
Copyright © International Centre for Diffraction Data 2012

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References

Carbone, J., Zulfiquar, A., Borman, C., Czebiniak, S., and Ziegler, H. (1998). “Large format CID X-ray image sensors,” Proceedings of SPIE 3301, 90. doi:10.1117/12.304550, Solid State Sensor Arrays: Development and Applications II.Google Scholar
Gottwald, A., Kroth, U., Krumrey, M., Richter, M., Scholze, F., and Ulm, G. (2006). “The PTB high accuracy spectral responsivity scale in the VUV and X-ray range,” Metrologia 43, 21–23.Google Scholar
Haugh, M. J. and Schneider, M. (2011). (in process). “Quantitative measurements of X-ray energy,” in Photodiodes-Communications, Bio-Sensing, Measurements and High Energy Physics (InTech Publisher, www.intechweb.org).Google Scholar
International Radiation Detectors (IRD) (n.d.), available from http://www.ird-inc.com/axuvhighnrg.html Google Scholar
Janesick, J. (2000). Scientific Charge-Coupled Devices (SPIE Press, Bellingham, WA).Google Scholar
Knoll, G. F. (2001). Radiation Detection and Measurement (John Wiley & Sons, New York, NY), 3rd ed. Google Scholar
Maddox, B., Park, H. S., Remington, B. A., Izumi, N., Chen, S., Chen, C., Kimminau, G., Ali, Z., Haugh, M. J., and Ma, Q. (2011). “High-energy X-ray backlighter spectrum measurements using calibrated image plates,” Rev. Sci. Instrum. 82, 023111.Google Scholar
Marshall, F. J., Ohki, T., McInnis, D., Ninkov, Z., and Carbone, J. (2001). “Imaging of laser–plasma X-ray emission with charge-injection devices,” Rev. Sci. Instrum. 72, 713.Google Scholar
Physikalisch-Technische Bundensanstalt (PTB) (n.d.), available at http://www.ptb.de/index_en.html Google Scholar
Poletto, L., Boscolo, A., and Tondello, G. (1999). “Characterization of a charge-coupled detector in the 1100-0.14 nm (1 eV to 9 keV) spectral range,” Appl.Opt., 38, 29–36.Google Scholar
Quaranta, C., Canali, G., Ottavani, G., and Zanio, K. (1969). “Electron-hole pair ionization energy in CdTe between 85 K and 350 K,” Lett. Al Nuovo Dimento, 4, 908–910.Google Scholar