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Application of the overlap integral in X-ray diffraction powder pattern recognition

Published online by Cambridge University Press:  10 January 2013

Stephen L. Lawton  and
Lawrence S. Bartell
Stephen L. Lawton
Affiliation:
Mobil Research and Development Corporation, Research Department, P.O. Box 480, Paulsboro, New Jersey 08066
Lawrence S. Bartell
Affiliation:
Department of Chemistry, University of Michigan, Ann Arbor, Michigan 48109
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Abstract

Use of the overlap integral in X-ray diffraction (XRD) powder pattern recognition of crystalline materials is presented. The mathematical expression, derived specifically for diffraction data, provides a measure of similarity between two patterns. Each pattern is represented by a normalized mathematical function. The index of similarity, or overlap integral, indicates how faithfully the two functions overlap and ranges from zero to unity, reaching the latter limit when the two patterns become identical.

Keywords

overlap integralpowder pattern recognitionsearch/match
Type
Research Article
Information
Powder Diffraction , Volume 9 , Issue 2 , June 1994 , pp. 124 - 135
Copyright
Copyright © Cambridge University Press 1994

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