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An EXAFS study of photographic development in thermographic films

Published online by Cambridge University Press:  01 March 2012

T. N. Blanton ,
D. R. Whitcomb  and
S. T. Misture
T. N. Blanton
Affiliation:
Eastman Kodak Company, Kodak Research Laboratories, Rochester, New York 14650-2106
D. R. Whitcomb
Affiliation:
Eastman Kodak Company, Oakdale, Minnesota 55129
S. T. Misture
Affiliation:
Alfred University, New York State College of Ceramics, Alfred, New York 14802
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Abstract

Silver K edge extended X-ray absorption fine structure (EXAFS) spectroscopy of films containing silver behenate (AgBeh) in the unprocessed, fully processed, and step-processed states has been performed. The results of the EXAFS analysis indicate that the intensity for the real-space peak for the Ag-O distance (∼2.3 Å) decreases while the real-space peak for the Ag-Ag distance (∼2.9 Å) grows with increasing thermal processing of the film. The changes observed in the real-space EXAFS signal indicate the growth of metallic silver at the expense of AgBeh. The X-ray absorption near-edge spectroscopy (XANES) portion of the signal shows that the absorption edge position varies stepwise, with unprocessed films and pure AgBeh having an edge location at 25 506 eV, films processed from steps 1 through 10 have an absorption edge at 25 508 eV, and the fully processed film has an edge location at 25 512 eV.

Keywords

EXAFSsilver behenatethermographic filmXANES
Type
X-RAY DIFFRACTION AND RELATED TECHNIQUES
Information
Powder Diffraction , Volume 22 , Issue 2 , June 2007 , pp. 122 - 125
Copyright
Copyright © Cambridge University Press 2007

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References

Blanton, T., Lelental, M., Zdzieszynski, S., and Misture, S. T. (2002). “In Situ High-Temperature Study of Silver Behenate Reduction to Silver Metal using Synchrotron Radiation,” Adv. X-Ray Anal.AXRAAA 45, 371–376.Google Scholar
Blanton, T. N., Lelental, M., and Barnes, C. L. (2005a). “Characterization of Silver Image Formation in a Silver Behenate Photothermographic Imaging Element using X-ray Diffraction Techniques,” J. Imaging Sci. Technol.JIMTE6 49, 356–364.CrossRefGoogle Scholar
Blanton, T. N., Zdzieszynski, S., Nicolas, M., and Misture, S. (2005b). “An In Situ High-Temperature X-Ray Diffraction Study of Phase Transformations in Silver Behenate,” Adv. X-Ray Anal.AXRAAA 48, 27–32.Google Scholar
Bullut, A., Karabullut, K., Basaran, E., and Robinson, J. (2000). “A Glancing Incidence EXAFS Study of Evaporated Silver Films on Glass,” Turk. J. Phys.TJPHEY 24, 551–556.Google Scholar
Ravel, B. (2006). ATHENA 08.050 (Computer Software), Argonne National Laboratory, Argonne Illinois.Google Scholar
Ressler, T. (2003). WINXAS 2003 (Computer Software), Hamburg, Germany.Google Scholar
Teo, B. K. (1981). “Extended X-ray absorption fine structure (EXAFS) spectroscopy: Techniques and applications” in EXAFS Spectroscopy, edited by Teo, B. K. and Joy, D. C. (Plenum Press, New York), p. 3.CrossRefGoogle Scholar
Tolochko, B. P., Chernov, S. V., Nikitenko, S. G., and Whitcomb, D. R. (1998). “EXAFS Determination of the Structure of Silver Stearate [Ag(O2C(CH2)16CH3]2, and the Effect of Temperature on the Silver Coordination Sphere,” Nucl. Instrum. Methods Phys. Res. ANIMAER10.1016/S0168-9002(97)01044-9 405, 428–434.Google Scholar