Symposium M – Plasma Processing and Synthesis of Materials III
Research Article
Effect of Surface Preparation and Thermoplastic Adhesive Structure on the Adhesion Behavior of Peek®/Graphite Composites
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- 21 February 2011, 137
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The Progress of Plasma Anodization and its Applications
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- 21 February 2011, 143
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RF Discharge Modeling Through Solutions to the Moments of the Boltzmann Transport Equations
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- 21 February 2011, 149
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Preparation of YBaCuO Superconducting Thin Films by Microwave Plasma Enhanced OMCVD
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- 21 February 2011, 155
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Two-Dimensional Structure of Reactive Silane Plasmas in the Presence of Crossed Magnetic and Electric Fields
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- 21 February 2011, 161
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Microstructrures and Mechanical Properties of Ni-Base Alloys Consolidated by Vacuum Plasma Spray (VPS) Process
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- 21 February 2011, 169
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Heat Treatment of Zirconia Powders with Different Morphologies Under Thermal Plasma Conditions
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- 21 February 2011, 175
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Coherent Anti-Stokes Raman Spectroscopic Measurement of Air Entrainment in Argon Plasma Jets
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- 21 February 2011, 184
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Particle Velocity and Temperature Histories in a Plasma Plume: A Comparison of Measurements and Predictions
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- 21 February 2011, 191
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A Comparison of the Experimentally Measured and Theoretically Predicted Temperature Profiles for an Argon Plasma Jet Discharging into a Nitrogen Environment
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- 21 February 2011, 199
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Behavior of Alumina Particles in Atmospheric Pressure Plasma Jets
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- 21 February 2011, 207
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A Mathematical Representation of Transport Phenomena Inside a Plasma Torch
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- 21 February 2011, 213
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Simulation of Thermal Barrier Plasma-Sprayed Coatings
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- 21 February 2011, 221
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Influence of the arc Chamber Design and of the Surrounding Atmosphere on the Characteristics and Temperature Distributions of Ar-H2 and Ar-He Spraying Plasma Jets
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- 21 February 2011, 227
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‘Device Quality’ Silicon Dioxide Layers by Low Temperature PECVD Processes
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- 21 February 2011, 241
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A Comparison of CH4:H2 and C2H6:H2 Morie of GaAs
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- 21 February 2011, 247
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Assessment of Surface Damage of Gallium Arsenide due to Reactive Ion Etching
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- 21 February 2011, 255
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Plasma Parameter and Film Quality in the ECR-Plasma-CVD
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- 21 February 2011, 261
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The Use of Langmuir Probe Measurements to Study Reaction Kinetics in Remote Plasma-Enhanced Chemical Vapor Deposition of Silicon
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- 21 February 2011, 267
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Studies of Plasma Etching of High Temperature Superconducting Thin Films
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- 21 February 2011, 273
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