Hostname: page-component-5cf477f64f-rdph2 Total loading time: 0 Render date: 2025-04-03T14:10:57.809Z Has data issue: false hasContentIssue false
  • English
  • Français

ZnO: In Thin Films Prepared with Different Precursor Salts by Spray Pyrolysis and Studied by Electron Microscopy.

Published online by Cambridge University Press:  21 February 2011

D. R. Acosta ,
O. Lovera ,
A. Maldonado ,
R. Asomoza ,
H. Gómez ,
A. Palafox ,
M. De la L. Olvera  and
J. Palacios-Gómez
D. R. Acosta
Affiliation:
Instituto de Física, UNAM; A.P. 20–364, 01000 México D.F., MEXICO
O. Lovera
Affiliation:
Instituto de Física, UNAM; A.P. 20–364, 01000 México D.F., MEXICO
A. Maldonado
Affiliation:
CINVESTAV, Ing. Eléctrica, A.P. 14–740;07000, México D.F., MEXICO
R. Asomoza
Affiliation:
CINVESTAV, Ing. Eléctrica, A.P. 14–740;07000, México D.F., MEXICO
H. Gómez
Affiliation:
CINVESTAV, Ing. Eléctrica, A.P. 14–740;07000, México D.F., MEXICO
A. Palafox
Affiliation:
CINVESTAV, Ing. Eléctrica, A.P. 14–740;07000, México D.F., MEXICO
M. De la L. Olvera
Affiliation:
CINVESTAV, Ing. Eléctrica, A.P. 14–740;07000, México D.F., MEXICO
J. Palacios-Gómez
Affiliation:
Dpto. Ciencia de Materiales, ESFM-I:P.N., México D.F., MEXICO
Get access

Abstract

In this work we present some results of a systematical study of structural and optoelectronic properties of Zn O: In thin films obtained by spray pyrolysis when the acidity and the solvent used in starting solution were varied. Structure of our samples was derived from X ray diffraction and conventional electron microscopy observations.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 355: Symposium B1 – Evolution of Thin-Film and Surface Structure and Morphology , 1994 , 587
Copyright
Copyright © Materials Research Society 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Chopra, K., Major, S., and Pandya, D.K., Thin Sol. Films 102, (1983), 1 Google Scholar
[2] Leary, D.D.J., Barnes, J.O. and Jordan, A.G., J. Electrochem. Soc. 129, (1982), 233 Google Scholar
[3] Aranovich, J., Ortiz, A. and Bube, R., Vac. Sc. Tech. 16, (1982), 9941 Google Scholar
[4]. Sakai, H., Mater. Res. Symp. Proc. 95, (1987), 589 Google Scholar
[5] Dawar, A-L. and Koshi, J.C., J. of Mat Science, 19, (1984), 1 Google Scholar
[6] Jin, Z.C., Hamberg, I. and Granqvist, C., App. Phys. Let. 51, (1986), 149 Google Scholar
[7] Morgan, J.H. and Brodie, D.E., Can. J. Phys. 60, (1982), 1387 Google Scholar
[8] Hu, J. and Gordon, R., J. Appl. Phys. 71, (1987), 149 Google Scholar
[9] Raviendra, D. and Sharma, J.K., J. Appl. Phys 58, (1985), 838 Google Scholar
[10] Eberspracher, C., Fahrebruch, A. and Bube, R., Thin Solid Films 136, (1986), 10 Google Scholar
[11] de la Olvera, M., Maldonado, A., Asomoza, R., Konagi, M. and Asomoza, M. Thin Solid Films, 229, (1993), 196 Google Scholar
[12] Wenas, J.W., Yamada, A., Takahashi, K., Yosino, M. and Konagai, M., J. Appl. Phys. 70, (1991), 19 Google Scholar
[13] Tiburcio-Silver, A., Joubert, J.C., Labeau, M., Thin Solid Films 197, (1991) 195 Google Scholar