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Xrd and Hrem Studies of Nanocrystalline Cu and Pd

Published online by Cambridge University Press:  28 February 2011

G. W. Nieman ,
J. R. Weertman  and
R. W. Siegel
G. W. Nieman
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, IL 60208
J. R. Weertman
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, IL 60208
R. W. Siegel
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL, 60439

Abstract

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Consolidated powders of nanocrystalline Cu and Pd have been studied by x-ray diffraction (XRD) and high resolution electron microscopy (HREM) as part of an investigation of the mechanical behavior of nanocrystalline pure metals. XRD line broadening measurements were made to estimate grain size, qualitative grain size distribution and average long range strains in a number of samples. Mean grain sizes range from 4-60 nm and have qualitatively narrow grain size distributions. Long range lattice strains are of the order of 0.2-3% in consolidated samples. These strains apparently persist and even increase in Cu samples after annealing at 0.35 Tm (498K) for 2h, accompanied by an apparent increase in grain size of e2x. Grain size, grain size distribution width and internal strains vary somewhat among samples produced under apparently identical processing conditions. HREM studies show that twins, stacking faults and low-index facets are abundant in as-consolidated nanocrystalline Cu samples. Methodology, results and analysis of XRD and HREM experiments are presented.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 206: Symposium G – Clusters and Cluster-Assembled Materials , 1990 , 493
Copyright
Copyright © Materials Research Society 1991

References

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