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X-Ray Topography

Published online by Cambridge University Press:  15 February 2011

Michael Dudley
Michael Dudley*
Affiliation:
Department of Materials Science & Engineering, State University of New York at Stony Brook, Stony Brook, NY 11794-2275
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Abstract

A review of the technique of White Beam Synchrotron X-ray Topography is presented along with some examples of its applications in materials science. Among the topics covered are: the characterization of growth defects in KTiOPO4, ZnTe, and SiC single crystals; studies of phase transitions in perovskite-like crystals; and studies of rapid thermal processing damage in semiconductors. Methodologies for analyzing dislocations, twins (rotational, mirror and inversion twins), precipitates and other crystallographic defects, will be reviewed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 307: Symposium L – Applications of Synchrotron Radiation Techniques to Materials Science , 1993 , 213
Copyright
Copyright © Materials Research Society 1993

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References

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