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X-Ray Tomographic Microscopy of Nicalon Preforms and Chemical Vapor Infiltrated Nicalon/Silicon Carbide Composites

Published online by Cambridge University Press:  15 February 2011

M. D. Butts ,
S. R. Stock ,
J. H. Kinney ,
T. L. Starr ,
M. C. Nichols ,
C. A. Lundgren ,
T. M. Breunig  and
A. Guvenilir
M. D. Butts
Affiliation:
Georgia Institute of Technology, Atlanta CA 30332
S. R. Stock
Affiliation:
Georgia Institute of Technology, Atlanta CA 30332
J. H. Kinney
Affiliation:
Lawrence Livermore National Laboratory, Livermore CA 94550
T. L. Starr
Affiliation:
Georgia Institute of Technology, Atlanta CA 30332
M. C. Nichols
Affiliation:
Sandia National Laboratories, Livermore CA 94550
C. A. Lundgren
Affiliation:
E.I. DuPont de Nemours, Wilmington DE 19880
T. M. Breunig
Affiliation:
Georgia Institute of Technology, Atlanta CA 30332
A. Guvenilir
Affiliation:
Georgia Institute of Technology, Atlanta CA 30332
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Abstract

Following the evolving microstructure of composites through all stages of chemical vapor infiltration (CVI) is a key to improved understanding and control of the process. X-ray Tomographic Microscopy (XTM), i.e., very high resolution computed tomography, allows the microstructure of macroscopic volumes of a composite to be imaged nondestructively with resolution approaching one micrometer. Results obtained with XTM on dense SiC/SiC composites and on woven SiC fiber preforms illustrate how details of the densification process can be followed using this technique during interruptions in processing. Ways in which the three-dimensional microstructural information may be used to improve modeling are also indicated.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 250: Symposium R – Chemical Vapor Deposition of Refractory Metals and Ceramics II , 1991 , 215
Copyright
Copyright © Materials Research Society 1992

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References

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