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X-ray Scattering Studies of Molecular Ordering Phenomena in Confined Films

Published online by Cambridge University Press:  15 February 2011

Sunil K. Sinha ,
M. Tolan ,
G. Vacca ,
Z. Lit ,
M. Rafailovich ,
J. Sokolov ,
H. Lorenz ,
J. P. Kotthaus ,
Y. P. Feng  and
G. Grubel
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Sunil K. Sinha
Affiliation:
Corporate Research, Exxon Research & Engineering Company, Annandale, NJ 08801
M. Tolan
Affiliation:
Institut für Experimentalphysik der Universitat Kiel, 24098 Kiel, Germany
G. Vacca
Affiliation:
Corporate Research, Exxon Research & Engineering Company, Annandale, NJ 08801
Z. Lit
Affiliation:
Materials Science Department, SUNY, Stonybrook, NY 11794-2275
M. Rafailovich
Affiliation:
Materials Science Department, SUNY, Stonybrook, NY 11794-2275
J. Sokolov
Affiliation:
Materials Science Department, SUNY, Stonybrook, NY 11794-2275
H. Lorenz
Affiliation:
Sektion Physik, Ludwig-Maximilians - Universitat München, 80539 München, Germany
J. P. Kotthaus
Affiliation:
Sektion Physik, Ludwig-Maximilians - Universitat München, 80539 München, Germany
Y. P. Feng
Affiliation:
Corporate Research, Exxon Research & Engineering Company, Annandale, NJ 08801
G. Grubel
Affiliation:
ESRF, Grenoble, France
D. Abernathy
Affiliation:
ESRF, Grenoble, France
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Abstract

A knowledge of the structural behavior of molecules confined in thin liquid films and the way in which they differ from bulk behavior is of great importance to a variety of technological applications. We discuss X-ray scattering studies of the conformation of liquid polymer wetting layers on laterally structured substrates in order to test theories of the conformality of the wetting layer to the substrate. Recent work on guided X-ray beams confined to the thin film opens up the possibility of detailed studies of ordering phenomena in molecular layers adjacent to solid surfaces. Recent experiments are discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 366: Symposium N – Dynamics in Small Confining Systems , 1994 , 3
Copyright
Copyright © Materials Research Society 1995

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References

1. Garoff, S., Sirota, E.B., Sinha, S.K., and Stanley, H.B., J. Chem. Phys. 90, 7505 (1989).Google Scholar
2. Tidswell, I.M., Rabedeau, T.A., Pershan, P.S., and Kosowsky, S.D., Phys. Rev. Lett. 66, 2108 (1991).Google Scholar
3. Tolan, M., Vacca, G., Sinha, S.K., Li, Z., Rafailovich, M., Sokolov, J., Lorenz, H., and Kotthaus, J.P., J. Phys. D (Appl. Phys.) to be published.Google Scholar
4. Andelman, D., Joanny, J.-F., and Robbins, M.O., Europhys. Lett. 7, 731 (1988); M.O. Robbins, D. Andelman, and J.-F. Joanny, Phys. Rev. A 43, 4344 (1991).Google Scholar
5. Tolan, M., König, G., Brügemann, L., Press, W., Brinkop, F., and Kotthaus, J.P., Europhys. Lett. 20, 223 (1992).Google Scholar
6. Tolan, M., Press, W., Brinkop, F., and Kotthaus, J.P., J. Appl. Phys. 75, 7761 (1994).Google Scholar
7. Hardin, J., Private Communication.Google Scholar
8. Idziak, S.H., Safinya, C.R., Hil, R.S., Kraiser, K.E., Ruths, M., Warriner, H.E., Steinberg, S., Liang, K.S., and Israelachvili, J.N., Science 264, 1915 (1994).Google Scholar
9. Feng, Y.P., Sinha, S.K., Deckman, H.W., Hastings, J.B., and Siddons, D.P., Phys. Rev. Lett. 71, 537 (1993).Google Scholar
10. Zheludeva, S.I., Kovalchuk, M.V., Novicova, N.N., Sosphenov, A.N., Malaysheva, N.E., Salashchenko, N.N., Akhsakhalay, A.D., and Platonov, Yu. Yu., Thin Solid Films 232, 252 (1993).Google Scholar
11. Tien, P.K. and Ulrich, R., J. Opt. Soc. Am. 60, 1325 (1970).Google Scholar
12. DeWames, R.E. and Sinha, S.K., Phys. Rev. B 7, 917 (1973).Google Scholar
13. Croce, P. and Pardo, B., Nuov. Rev. Opt. Appl. 1(4), 229 (1970); see also M. Maaza, et al., J. Phys. Lett. A (1994).Google Scholar
14. Spiller, E. and Segmüller, A., Appl. Phys. Lett. 24, 60 (1974).Google Scholar
15. Feng, Y.P., Sinha, S.K., Grübel, G., and Abernathy, D., to be published.Google Scholar
16. Wang, J., Bedzyk, M.J., and Caffr-ey, M., Science, 258, 775 (1992).Google Scholar
17. Feng, Y.P., Deckman, H.W., and Sinha, S.K., Appl. Phys. Lett. 64, 930 (1994).Google Scholar
18. Steinhauser, K.A., Steyerl, A., Sheckenhofer, H., and Malik, S.S., Phys. Rev. Lett. 44, 1306 (1980).Google Scholar
19. Feng, Y.P., Majkrzak, C.F., Sinha, S.K., Wiesler, D.G., Zhang, H., and Deckman, H.W., Phys. Rev. B 49, 10814 (1994).Google Scholar
20. Pardo, B., Maaza, M., and Sella, C., Physica B 198, 235 (1994).Google Scholar
21. Norton, L.J., Kramer, E.J., Jones, R.A.L., Bates, F.S., Brown, H.R., Felcher, G.P., and Kleb, R., J. Phys. II (France) 4, 1 (1994).Google Scholar
22. Zhang, H., CGallagher, P.D., Satija, S.K., Lindstrom, R.M., Paul, R.L., Russell, T.P., Lambooy, P., and Kramer, E.J., Phys. Rev. Lett. 72, 3044 (1994).Google Scholar