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X-Ray Reflectivity and Fluorescence Measurements From Polystyrene-Co-Bromostyrene/Polystyrene Interfaces

Published online by Cambridge University Press:  22 February 2011

J. Sokolov ,
M. Rafailovich ,
X. Zhao ,
W.B. Yun ,
R.A.L. Jones ,
E.J. Kramer ,
R.J. Composto ,
R.S. Stein ,
A. Bommannavar  and
M. Engbretson
J. Sokolov
Affiliation:
QUEENS COLLEGE, FLUSHING, NY
M. Rafailovich
Affiliation:
QUEENS COLLEGE, FLUSHING, NY
X. Zhao
Affiliation:
QUEENS COLLEGE, FLUSHING, NY
W.B. Yun
Affiliation:
ARGONNE NATIONAL LABORATORY, ARGONNE, IL
R.A.L. Jones
Affiliation:
CORNELL UNIVERSITY, ITHACA, NY
E.J. Kramer
Affiliation:
CORNELL UNIVERSITY, ITHACA, NY
R.J. Composto
Affiliation:
UNIVERSITY OF MASSACHUSETTS AT AMHERST, AMHERST, MA
R.S. Stein
Affiliation:
UNIVERSITY OF MASSACHUSETTS AT AMHERST, AMHERST, MA
A. Bommannavar
Affiliation:
BROOKLYN COLLEGE, BROOKLYN, NY
M. Engbretson
Affiliation:
OAK RIDGE NATIONAL LABORATORY, OAK RIDGE, TENN
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Abstract

X-ray fluorescence using synchrotron radiation at glancing angles of incidence was used to measure interface widths for the highly immiscible polymer blend system polystyrene/polybromostyrene (PS/PBrxS, with bromination level x = 0.8 bromine atoms per monomer). The interfacial widths are for bilayers annealed for 4 hours and 24 hours at 141±1C are found to be 100± 20Å and 110±20Å respectively.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 171: Symposium O – Polymer Based Molecular Composites , 1989 , 337
Copyright
Copyright © Materials Research Society 1990

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References

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