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X-ray Probes of Magnetic Multilayer Structure

Published online by Cambridge University Press:  14 March 2011

B.K. Tanner ,
T.P.A. Hase ,
B.D. Fulthorpe ,
J. Clarke ,
G.M. Luo ,
S.K. Halder ,
A.S.H. Rozatian  and
S.B. Wilkins
B.K. Tanner
Affiliation:
Department of Physics, University of Durham, South Road, Durham, DH1 3LE, U.K.
T.P.A. Hase
Affiliation:
Department of Physics, University of Durham, South Road, Durham, DH1 3LE, U.K.
B.D. Fulthorpe
Affiliation:
Department of Physics, University of Durham, South Road, Durham, DH1 3LE, U.K.
J. Clarke
Affiliation:
Department of Physics, University of Durham, South Road, Durham, DH1 3LE, U.K.
A.S.H. Rozatian
Affiliation:
Department of Physics, University of Durham, South Road, Durham, DH1 3LE, U.K.
S.B. Wilkins
Affiliation:
Department of Physics, University of Durham, South Road, Durham, DH1 3LE, U.K.
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Abstract

We discuss the application of x-ray scattering and fluorescence to the problem of unravelling the relationship between the structural and magnetic properties of magnetic multilayers. Particular attention is paid to the use of grazing incidence diffuse scatter to determine the compositional gradient, out-of-plane roughness amplitude, in-plane correlation length and fractal parameter of buried interfaces. Anomalous scattering provides information on the local environment of specific atoms and grazing incidence fluorescence is a depth -sensitive probe of chemical composition. We present examples indicating the sensitivity limits and the reproducibility of the techniques, all from multiple layer structures of magnetic metals.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 615: Symposium G – Polycrystalline Metal & Magnetic Thin Films - 2000 , 2000 , G2.1.1
Copyright
Copyright © Materials Research Society 2000

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References

REFERENCES

[1] Joyce, D E, Faunce, C A, Grundy, P J, Fulthorpe, B D, Hase, T P A, Pape, I and Tanner, B K, Phys Rev B 58 5594 (1998)10.1103/PhysRevB.58.5594Google Scholar
[2] Pape, I, Hase, T P A, Tanner, B K anWormington, d M, Physica B 253 278 (1998)10.1016/S0921-4526(98)00395-0Google Scholar
[3] Worminton, M, Bowen, D K and Tanner, B K, Mater. Res. Soc. Symp. Proc. 238 119 (1992)10.1557/PROC-238-119Google Scholar
[4] Wormington, M, Panaccione, C, Matney, K M and Bowen, D K, Phil. Trans. Roy. Soc. 357 2827 (1999)10.1098/rsta.1999.0469Google Scholar
[5] Hase, T P A, Tanner, B K, Ryan, P, Marrows, C H and Hickey, B J, I.E.E.E. Trans. Magnetics 34 831 (1998)10.1109/20.706271Google Scholar
[6] Brown, E and Wormington, M, submitted to Adv. X-ray Anal. (2000)Google Scholar
[7] Sinha, S K, Sirota, E B, Garoff, S and Stanley, H B Phys Rev. B 38 2973 (1988)10.1103/PhysRevB.38.2297Google Scholar
[8] Wormington, M, Pape, I, Hase, T P A, Tanner, B K and Bowen, D K, Phil. Mag. Letts 74 211 (1996)10.1080/095008396180371Google Scholar
[9] Savage, D E, Lagally, M G, Kleiner, J, Schimke, N, Phang, Y H, Jankowski, T, Jacobs, J and Kariotis, R, J. Appl. Phys., 69(3), 1411 (1991)10.1063/1.347281Google Scholar
[10] Salditt, T, Lott, D, Metzger, T H, Peisl, J, Vignaud, G, Hoghoj, P, Schärpf, O, Hinze, P and Lauer, R, Phys. Rev. B 54 5860 (1996)10.1103/PhysRevB.54.5860Google Scholar
[11] Holý, V and Baumbach, T, Phys. Rev. B 49 10668 (1994)10.1103/PhysRevB.49.10668Google Scholar
[12] Clarke, J, Marrows, C H, Stanley, F E, Bunyan, R J T, Tanner, B K and Hickey, B J, J Phys D: Appl. Phys. 32 1169 (1999)10.1088/0022-3727/32/10/314Google Scholar
[13] Stragier, H, Cross, J O, Rehr, J J, Sorensen, L B, Bouldin, C E and Woicik, J C, Phys. Rev. Lett. 69 3064 (1992)10.1103/PhysRevLett.69.3064Google Scholar
[14] Sakurai, K, Spectrochimia Acta B 54 1497 (1999)10.1016/S0584-8547(99)00071-3Google Scholar