Hostname: page-component-745bb68f8f-f46jp Total loading time: 0 Render date: 2025-02-10T08:17:31.444Z Has data issue: false hasContentIssue false
  • English
  • Français

X-Ray Microscopy Of Multiphase Polymeric Materials

Published online by Cambridge University Press:  15 February 2011

H. Ade ,
A. P. Smith ,
G. R. Zhuang ,
B. Wood ,
I. Plotzker ,
E. Rightor ,
D.-J. Liu ,
S.-C. Lui  and
C. Sloop
H. Ade
Affiliation:
Dept. of Physics, North Carolina State University, Raleigh, NC 27695–8202
A. P. Smith
Affiliation:
Dept. of Physics, North Carolina State University, Raleigh, NC 27695–8202
G. R. Zhuang
Affiliation:
Dept. of Physics, North Carolina State University, Raleigh, NC 27695–8202
B. Wood
Affiliation:
Experimental Station, DuPont, Wilmington, DE 19880–0323
I. Plotzker
Affiliation:
Experimental Station, DuPont, Wilmington, DE 19880–0323
E. Rightor
Affiliation:
Texas Polymer Center, B-1470, Dow Chemical, Freeport, TX 77541
D.-J. Liu
Affiliation:
AlliedSignal Technology, 50 E. Algonquin Rd., Des Plaines, IL 60017–5016
S.-C. Lui
Affiliation:
AlliedSignal Technology, 50 E. Algonquin Rd., Des Plaines, IL 60017–5016
C. Sloop
Affiliation:
IBM Corp., Research Triangle Park, NC
Get access

Abstract

We have utilized the scanning transmission x-ray microscope at Brookhaven National Laboratory to acquire high energy resolution spectra of various polymers and to investigate the bulk characteristics of multiphasic polymeric materials with chemical sensitivity at a spatial resolution of about 50 nm. We present studies ranging from phase separated liquid crystalline polyesters and polyurethanes to various polymer blends. Improvements in the NEXAFS imaging and spectral acquisition protocol in the recent past provide much improved spectral fidelity and include in situ energy calibration with CO2.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 437: Symposium DD – Applications of Synchrotron Radiation to III , 1996 , 99
Copyright
Copyright © Materials Research Society 1996

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Ade, H., Zhang, X., Cameron, S., Costello, C., Kirz, J., and Williams, S., Science 258, 972 (1992), and H. Ade, A. P. Smith, S. Cameron, R. Cieslinski, B. Hsiao, G. Mitchell, and E. Rightor, Polymer 36, 1843–1848 (1995).Google Scholar
2. see, for example, Stöhr, J., NEXAFS Spectroscopy (Springer, Berlin, 1992).Google Scholar
3. Ade, H. and Hsiao, B., Science 262, 1427–1429 (1993).Google Scholar
4. Rightor, E. G., Mitchell, G., Fisher, D., Hitchcock, A.P., Urquhart, S.G., Leapman, R.D., Smith, A.P., Ade, H., Shin, H. J., Warwick, T., to be submitted to J. Phys. Chem.Google Scholar
5. Kirz, J., Burge, R., and Rarback, H., Ann. NY. Acad. Sci 342, 135–147 (1980), and J. Kirz, I-I. Ade, M. Howells, C. Jacobsen, K. H. Ko, S. Lindaas, I. McNulty, D. Sayre, S. Williams, and X. Zhang, Rev. Sci. Instrum. 63, 557–563 (1992).Google Scholar
6. Jacobsen, C, Williams, S., Anderson, E., Brown, M. T., Buckley, C. J., Kern, D., Kirz, J., Rivers, M., and Zhang, X., Optics Comm. 86, 351 (1991).Google Scholar
7. Anderson, E. and Kern, D., in X-ray Microscopy III, Michette, A., Morrison, G., and Buckley, C., eds. (Springer, Berlin 1992).Google Scholar
8. Zhang, X., Jacobsen, C., and Williams, S., in Soft X-ray Microscopy, Jacobsen, C. and Trebes, J., eds., Proc. SPIE 1741, 251–259 (1992).Google Scholar
9. Urquhart, S. G., Hitchcock, A. P., Leapman, R. D., Priester, R. D., and Rightor, E. G., “Analysis of Polyurethanes Using Core Excitation Spectroscopy. Part I: Model Polyurethane Foam Polymers,” J. Polym. Sci. B, Polym. Phys. 33, 1593 (1995).Google Scholar
10. Urquhart, S. G., Hitchcock, A. P., Priester, R. D., and Rightor, E. G., “Analysis of Polyurethanes Using Core Excitation Spectroscopy. Part II: Inner Shell Spectra of Ether, Urea and Carbamate Model Compounds,” J. Polym. Sci. B, Polym. Phys. 33, 1603 (1995).Google Scholar