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X-Ray Double Crystal Diffraction Characterization of Epitaxial Magnetic Transiton Metal Difluorides

Published online by Cambridge University Press:  21 February 2011

M. Lui ,
A. R. King ,
V. Jaccarino ,
R. F. C. Farrow  and
S. S. P. Parkins
M. Lui
Affiliation:
Department of Physics, University of California, Santa Barbara, CA 93106 Hughes Research Laboratories, 3011 Malibu Canyon Road, Malibu, CA 90265
A. R. King
Affiliation:
Department of Physics, University of California, Santa Barbara, CA 93106
V. Jaccarino
Affiliation:
Department of Physics, University of California, Santa Barbara, CA 93106
R. F. C. Farrow
Affiliation:
IBM Research Division, Almaden Research Center, 650 Harry Road, San Jose, CA 95120-6099
S. S. P. Parkins
Affiliation:
IBM Research Division, Almaden Research Center, 650 Harry Road, San Jose, CA 95120-6099
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Abstract

Epitaxial films of a variety of magnetic transition metal difluoride films have been grown by molecular beam epitaxy techniques. The structural quality of these films have been characterized using X-ray double crystal rocking curve analysis. The observed rocking curve linewidths were compared to their intrinsic values as calculated by dynamical diffraction theory. The degree of crystalline perfection as judge by the rocking curves have been correlated with the amount of lattice mismatch between the various epitaxial films and substrates. In the well lattice match case (Δa/a < 0.2%) of epitaxial films of FeF2 and CoF2 grown on (001) ZnF2 substrates, the rocking curve line widths approached their intrinsic limit indicative of extremely high quality material. This work represents some of the best epitaxial magnetic insulating films grown to date.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 187: Symposium J – Thin Film Structures and Phase Stability , 1990 , 267
Copyright
Copyright © Materials Research Society 1990

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