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X-Ray Diffractometer for the Study of a Monomolecular Film Spread on a Liquid Substrate

Published online by Cambridge University Press:  21 February 2011

Karl M. Robinson  and
J. Adin Mann JR
Karl M. Robinson
Affiliation:
Case Western Reserve University, Dept. of Chemical Engineering, Cleveland, OH 44106
J. Adin Mann JR
Affiliation:
Case Western Reserve University, Dept. of Chemical Engineering, Cleveland, OH 44106
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Abstract

The study of ultrathin films spread on liquid substrates has been limited to macroscopic observations of general film behavior. Synchrotron radiation has provided the means of observing the two-dimensional crystalline properties of monolayers. Our recent experiments performed on NSLS X-23B beam line was the trial run of a new liquid surface diffractometer. Major emphasis has been placed on vibrational and environmental isolation of the film, in addition to 0.1 micron resolution in the control of beam positioning. The film is examined in a closed, ultraclean environment consisting of a fused silica trough, purified N2 atmosphere, 0.1°C temperature control and chromatography grade or better solvents and surfactants. Surface properties (surface tension, and visco-elastic moduli) are monitored by surface laser light scattering spectroscopy. The x-ray scattering pattern from the liquid surface contains the expected specular reflection as well as scattered peaks at small wave numbers. We believe these to be caused by high frequency surface ripple fields.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 143: Symposium V – Synchrotron Radiation in Materials Research , 1988 , 31
Copyright
Copyright © Materials Research Society 1989

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