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X-Ray Diffraction (Pole Figure) Study of the Epitaxy of Gold Thin Films on GaAs

Published online by Cambridge University Press:  15 February 2011

Siu Leung
Affiliation:
Department of Electrical Engineering, Center for the Joining of Materials, Carnegie-Mellon University, Pittsburgh, PA 15213, (U.S.A.)
A. G. Milnes
Affiliation:
Department of Electrical Engineering, Center for the Joining of Materials, Carnegie-Mellon University, Pittsburgh, PA 15213, (U.S.A.)
D. D. L. Chung
Affiliation:
Department of Metallurgical Engineering and Materials Science, Center for the Joining of Materials, Carnezie-Mellon University, Pittsburgh, PA 15213, (U.S.A.)
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Abstract

X-ray diffraction (pole figure) measurements were made on gold thin films (300–2300 Å) evaporated on GaAs{111} and GaAs{001} to investigate the heteroepitaxy and twinning of the gold films and the chemoepitaxy of Au7Ga2 on GaAs. For both GaAs orientations the epitaxial relationship (hkl)AU[hkl]Au/ (hkl)GaAs[hkl]GaAs was observed for all values of h, k and l. In addition, twin orientations were observed. For GaAs{111}, fourfold rotation twinning about the Au[l11] direction resulted in four azimuthal orientations: [112]Au // [112]GaAs, [112]Au// [112]GaAs, [112]Au// [110]GaAs, and [112]AU/ [110]GaAs. For GaAs{001}, reflection twinning with the four Au{111} planes as twinning planes resulted in four other orientations with Au(001) at approximately 71° from GaAs(001). The relative amounts of the twins depended on the substrate temperature, the film thickness and the deposition rate. Chemoepitaxy was observed for Au7Ga2 on GaAs{111} the epitaxial relationship was (111)Au/ (0110)Au7Ga2/(111)GaAsand Au7Ga2[0001] was off by 10° from GaAs[110], toward GaAs[011], i.e. Au7Ga2[0001] was off by 10° from Au[110], toward Au[011]. This relationship corresponds to a perfect lattice match between Au7Ga2 and gold.

Type
Research Article
Copyright
Copyright © Materials Research Society 1982

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References

REFERENCES

1 Vaidya, S. and Sinha, A. K., Thin Solid Films, 75 (1981) 253.CrossRefGoogle Scholar
2 Dhere, N. G., Arsenio, T. P. and Patnaik, B. K., Thin Solid Films, 44 (1977) 29.CrossRefGoogle Scholar
3 Asselin, G. P. and Wayman, C. M., Phys. Status Solidi A, 24 (1974) 675.CrossRefGoogle Scholar
4 Igasaki, Y and Mitsuhashi, H., Thin Solid Films, 51 (1978) 33.CrossRefGoogle Scholar
5 Takeda, K., Hanawa, T. and Shimojo, T., Proc. 6th Int. Vacuum Congr., Kyoto, 1974, in Jpn. J. Appl. Phy s., Suppl. 2, Part 1 (1974) 589.Google Scholar
6 Snyman, L. W., Vermaak, J. S. and Auret, F. D., Verrigt.–Elektronmikroskopiever. Suidelike Afr., 7 (1977) 45.Google Scholar
7 Vermaak, J. S., Snyman, L. W. and Auret, F. D., J. Cryst. Growth, 42 (1977) 132.CrossRefGoogle Scholar
8 Barrett, C. S. and Massalski, T. B., Structure of Metals, 3rd edn., Pergamon, Oxford, 1980, pp. 406, 570.Google Scholar
9 Zeng, X.–F. and Chung, D. D. L., J. Appl. Phys., to be published.Google Scholar
10 Fischer, W. and Wissmann, P., Z. Naturforsch., A, 31 (1976) 190.CrossRefGoogle Scholar
11 Fischer, W., Geiger, H., Rudolf, P. and Wissmann, P., Appl. Phys., 13 (1977) 245.CrossRefGoogle Scholar
12 Chen, H., White, G. E., Stock, S. R. and Ho, P. S., Thin Solid Films, 93 (1982) 161.CrossRefGoogle Scholar
13 Zeng, X.–F. and Chung, D. D. L., Thin Solid Films, 93 (1982) 207.CrossRefGoogle Scholar
14 Massies, J., Delescluse, P., Etienne, P. and Linh, N. T., Thin Solid Films, 90 (1982) 113.CrossRefGoogle Scholar
15 Massies, J. and Linh, N. T., J. Cryst. Growth, 56 (1982) 25.CrossRefGoogle Scholar
16 Massies, J., Chaplart, J. and Linh, N. T., Solid State Commun., 32 (1979) 707.CrossRefGoogle Scholar
17 Ludeke, R., Landgren, G. and Chang, L. L., Proc. 8th Int.Vacuum Congr., Cannes, September 1980, Google Scholar
17a in Vide. Couches Minces, Suppl., 201 (1980) 579.Google Scholar
18 Petroff, P. M., Feldman, L. C., Cho, A. Y. and Williams, R. S., Proc. 2nd Int. Workshop on Molecular Beam Epitaxy, Cornell University, October 21–22, 1980, CrossRefGoogle Scholar
18a in J. Appl. Phys., 52 (1981) 7317.CrossRefGoogle Scholar
19 Ijevlev, V. M. and Bugakov, A. V., Thin Solid Films, 60(1979) 105.CrossRefGoogle Scholar
20 Yoshiie, T. and Bauer, C. L., personal communication, 1982.Google Scholar
21 Fontaine, C., Okumura, T. and Tu, K. N., J. Appl. Phys., 54 (1983) 1404.CrossRefGoogle Scholar