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X-ray Absorption and Reflection as Probes of the GaN Conduction Bands: Theory and Experiment of the N-K-Edge and Ga M2,3, Edges

Published online by Cambridge University Press:  10 February 2011

W. R. L. Lambrecht
Affiliation:
Department of Physics, Case Western Reserve University, Cleveland, OH 44106–7079
S. N. Rashkeev
Affiliation:
Permanent address: P. N. Lebedev Physical Institute, Russian Academy of Sciences, 117924 Moscow, Russia
B. Segall
Affiliation:
Department of Physics, Case Western Reserve University, Cleveland, OH 44106–7079
K. Lawniczak-Jablonska
Affiliation:
Permanent address: Institute of Physics, Polish Academy of Sciences, 02-668 Warszawa, Poland
T. Suski
Affiliation:
Permanent address: UNIPRESS, Polish Academy of Sciences, 01-142 Warszawa, Poland
E. M. Gullikson
Affiliation:
Lawrence Berkeley National Laboratory, University of California, Berkeley, CA 94720
J. H. Underwood
Affiliation:
Lawrence Berkeley National Laboratory, University of California, Berkeley, CA 94720
R. C. C. Perera
Affiliation:
Lawrence Berkeley National Laboratory, University of California, Berkeley, CA 94720
J. C. Rife
Affiliation:
Naval Research Laboratory, Washington, D. C. 20375
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Abstract

X-ray absorption and glancing angle reflectivity measurements in the energy range of the Nitrogen K-edge and Gallium M2,3 edges are reported. Linear muffin-tin orbital band-structure and spectral function calculations are used to interpret the data. Polarization effects are evidenced for the N-K-edge spectra by comparing X-ray reflectivity in s- and p-polarized light.

Type
Research Article
Copyright
Copyright © Materials Research Society 1997

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References

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