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X-ray Absorption and Reflection as Probes of the GaN Conduction Bands: Theory and Experiment of the N-K-Edge and Ga M2,3, Edges
Published online by Cambridge University Press: 10 February 2011
Abstract
X-ray absorption and glancing angle reflectivity measurements in the energy range of the Nitrogen K-edge and Gallium M2,3 edges are reported. Linear muffin-tin orbital band-structure and spectral function calculations are used to interpret the data. Polarization effects are evidenced for the N-K-edge spectra by comparing X-ray reflectivity in s- and p-polarized light.
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- Copyright © Materials Research Society 1997
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