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XPS Spectra and Optical Reflectivity of Yttrium Stabilised Zirconia

Published online by Cambridge University Press:  25 February 2011

P. Camagni
Affiliation:
Dipartimento di Fisica “A.Volta” dell'UniversitA di Pavia, 27100 Pavia, (Italy)
L.E. Depero
Affiliation:
Dipartimento Ingegneria Meccanica Università di Brescia, 25060 Brescia, (Italy)
F. Parmigiani
Affiliation:
CISE Technol. Innovative S.p.A., Materials Div., P.O.Box 12081, 20134 Milano, (Italy)
G. Samoggia
Affiliation:
Dipartimento di Fisica “A.Volta” dell'UniversitA di Pavia, 27100 Pavia, (Italy)
L. Sangaletri
Affiliation:
Dipartimento di Fisica “A.Volta” dell'UniversitA di Pavia, 27100 Pavia, (Italy)
M. Scagliotri
Affiliation:
CISE Technol. Innovative S.p.A., Materials Div., P.O.Box 12081, 20134 Milano, (Italy)
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Abstract

X-ray photoelectron spectroscopy measurements and synchrotron radiation reflectivity and measurements in the photon energy range between 5eV and 30 eV are reported for yttrium stabilised zirconia single crystals. From the present data some behaviour of the valence band and conduction band electronic structure are elucidated. Two features present in the valence band XPS spectra, not explained on the basis of one-clectron theory, are tentatively assigned to simultaneous two electron excitation.

Type
Research Article
Copyright
Copyright © Materials Research Society 1993

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References

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