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XPS Characterization of Mixed Carbides Obtained from Polymer Precursors
Published online by Cambridge University Press: 28 February 2011
Abstract
Polymer precursors for Si-C, Si-Ti-C-O and Si-Al-C-O systems have been obtained from polycarbosilane and the corresponding metal alkoxides. X-ray Photoelectron Spectroscopy (XPS) has been used to follow the structural evolution of these preceramic compounds during the pyrolysis process.
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- Copyright © Materials Research Society 1990
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