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XANES Studies at N and C K-Edge of Compounds in the Ternary System Si-C-N

Published online by Cambridge University Press:  15 February 2011

P. Kroll
Affiliation:
Fachgebiet Disperse Feststoffe, Fachbereich Materialwissenschaft, Technische Hochschule Darmstadt, 64295 Darmstadt, Germany
A. Greiner
Affiliation:
Fachgebiet Disperse Feststoffe, Fachbereich Materialwissenschaft, Technische Hochschule Darmstadt, 64295 Darmstadt, Germany
R. Riedel
Affiliation:
Fachgebiet Disperse Feststoffe, Fachbereich Materialwissenschaft, Technische Hochschule Darmstadt, 64295 Darmstadt, Germany
S. Bender
Affiliation:
Physikalisches Institut, Universitat Bonn, 53115 Bonn, Germany
R. Franke
Affiliation:
Physikalisches Institut, Universitat Bonn, 53115 Bonn, Germany
J. Hormes
Affiliation:
Physikalisches Institut, Universitat Bonn, 53115 Bonn, Germany
A. A. Pavlychev
Affiliation:
Physikalisches Institut, Universitat Bonn, 53115 Bonn, Germany
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Abstract

We report on XANES-investigations at the nitrogen and carbon K-edge of Si-C-N containing solid phases prepared by the reaction of silicon tetrachloride with bis(trimethylsilyl)carbodiimide and annealing the reaction product at temperatures between room temperature (RT) and 1600°C. From the spectra it is possible to evidence the evolution of four phase regions and their different structural increments. We can relate the observed changes of atomic excitations to chemical and structural effects. By that means proposed structural models for the different phases are testified.

Type
Research Article
Copyright
Copyright © Materials Research Society 1996

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References

[1] Konigsberger, D.C. & Prins, R., X-Ray Absorption, John Wiley and Sons, (1988); J. Stöhr, NEXAFS Spectroscopy, Springer Series in Surface Science Vol.25 (1992)Google Scholar
[2] Riedel, R., Kleebe, H.-J., Schönfelder, H., Aldinger, F., Nature 374 (1995) 526 Google Scholar
[3] Riedel, R., Greiner, A., Miehe, G., Dreβler, W., Fueβ, H. and Bill, J.; submitted for publicationGoogle Scholar
[4] Kroll, P., Greiner, A., Riedel, R., Bender, S., Franke, R., Hormes, J., Pavlychev, A.A., this issueGoogle Scholar
[5] Althoff, K.-H., Drachenfels, W. von, Dreist, A., Husmann, D., Neckenig, H., Huhn, H.D., Schauerle, W., Schittko, H., Schittko, F.J., Wermelskirchen, C., Particle Accelerators 27 (1990) 101 Google Scholar
[6] Pavlychev, A.A., Akimov, V.N., Stepanow, A.P., Nekipelov, S.V., Phys. Scr. 41 (1990) 160 Google Scholar
[7] Sette, F., Stöhr, J., Hitchcock, A.P., J. Chem. Phys. 81 (1984) 4906 Google Scholar
[8] Newbury, D.C., Ishii, I., Hitchcock, A.P., Canadian J. of Chem. 64 (1986) 1145 Google Scholar