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Well Thickness And Doping Effects, And Room Temperature emission mechanisms in InGaN/GaN And GaN/AlGaN Multiple Quantum Wells

Published online by Cambridge University Press:  10 February 2011

K. C. Zeng
Affiliation:
Department of Physics, Kansas State University, Manhattan, KS, 66506–2601
M. Smith
Affiliation:
Department of Physics, Kansas State University, Manhattan, KS, 66506–2601
J. Y. Lin
Affiliation:
Department of Physics, Kansas State University, Manhattan, KS, 66506–2601
H. X. Jiang
Affiliation:
Department of Physics, Kansas State University, Manhattan, KS, 66506–2601
H. Tang
Affiliation:
Materials Laboratory and Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801
A. Salvador
Affiliation:
Materials Laboratory and Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801
W. Kim
Affiliation:
Materials Laboratory and Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801
H. Morkoc
Affiliation:
Materials Laboratory and Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801
M. Asif Khan
Affiliation:
Department of Electrical and Computing Engineering, University of South Carolina, Columbia, SC 29208.
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Abstract

Effects of well thickness and Si-doping on the photoluminescence (PL) emission properties of GaN/AlxGa1-xN (x ∼ 0.07) and InxGa1-xN/GaN (x ∼ 0.15–0.2) multiple quantum wells (MQWs) grown both by MOCVD and reactive MBE have been studied. The room temperature emission mechanisms have also been addressed.

Type
Research Article
Copyright
Copyright © Materials Research Society 1998

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