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VUV- and Soft X-Ray-Induced Optical Luminescence and X-Ray Absorption Fine Structures of Porous Silicon

Published online by Cambridge University Press:  25 February 2011

T. K. Sham ,
D. T. Jiang ,
I. Coulthard ,
J. W. Lorimer ,
X. H. Feng ,
K. H. Tan ,
S. P. Frigo ,
R. A. Rosenberg ,
D. C. Houghton  and
B. Bryskiewicz
T. K. Sham
Affiliation:
Department of Chemistry, University of Western Ontario, London, N6A 5B7, Canada
D. T. Jiang
Affiliation:
Department of Chemistry, University of Western Ontario, London, N6A 5B7, Canada
I. Coulthard
Affiliation:
Department of Chemistry, University of Western Ontario, London, N6A 5B7, Canada
J. W. Lorimer
Affiliation:
Department of Chemistry, University of Western Ontario, London, N6A 5B7, Canada
X. H. Feng
Affiliation:
Department of Chemistry, University of Western Ontario, London, N6A 5B7, Canada
K. H. Tan
Affiliation:
Department of Chemistry, University of Western Ontario, London, N6A 5B7, Canada
S. P. Frigo
Affiliation:
Synchrotron Radiation Center, University of Wisconsin-Madison, Stoughton, WI 53589
R. A. Rosenberg
Affiliation:
Advance Photon Source, Argonne National Laboratory, Argonne, IL 60439
D. C. Houghton
Affiliation:
Advance Photon Source, Argonne National Laboratory, Argonne, IL 60439
B. Bryskiewicz
Affiliation:
Institute for Microstructural Science, National Research Council, Ottawa Kl A 0R6, Canada.
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Abstract

Optical luminescence in porous silicon induced by soft X-ray and vacuum UV excitation with energies in the vicinity of the Si K-edge (1838 eV) and the Si L-edge (99 eV) has been observed. The luminescence has been used, together with total electron yield, to record X-ray absorption fine structure (XAFS) in the near-edge region of both Si edges. The near- edge spectra recorded simultaneously with either luminescence or total electron yield were compared, and the implications of these measurements for the structure of porous silicon are discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 281: Symposium D – Semiconductor Heterostructures for Photonic and Electronic Applications , 1992 , 525
Copyright
Copyright © Materials Research Society 1993

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References

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