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A Vibrational Technique for Stress Measurement in Films

Published online by Cambridge University Press:  16 February 2011

A. Jagota ,
S. Mazur  and
R. J. Farrisf
A. Jagota
Affiliation:
CR&D, Experimental Station, E.I. DuPont de Nemours & Co., Wilmington, Delaware 19880-0356.
S. Mazur
Affiliation:
CR&D, Experimental Station, E.I. DuPont de Nemours & Co., Wilmington, Delaware 19880-0356.
R. J. Farrisf
Affiliation:
Department of Polymer Science and Engineering, University of Massachusetts, Amherst, Massachusetts 01003.
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Abstract

This paper presents a new technique for the measument of stress in films based on the classical theory of membrane vibrations. The specimens for vibrational analysis are prepared by removing a circular or square piece of the substrate far from any edge of the film (this operation preserves the state of stress in the film). The specimen is mechanically excited by random noise and its natural frequencies are peaks in the measured response of the membrane. The natural frequencies increase as the square root of stress in the film. The only material parameter needed to determine stress from the natural frequency is the density of the film. The technique has been used to measure stress in two different systems: urethane cured epoxies and silver films under different environmental conditions (temperature and humidity).

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 188: Symposium K – Thin Films: Stresses and Mechanical Properties II , 1990 , 35
Copyright
Copyright © Materials Research Society 1990

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References

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