No CrossRef data available.
Article contents
Vibrational Properties of a-Si:H Films Containing Voids: Experiment and Modeling
Published online by Cambridge University Press: 15 February 2011
Abstract
In this paper, we present results about the vibrational properties of hydrogenated amorphous silicon films. We expect to explain the slight differences observed in the Raman spectra using atomic-scale modeling. In particular, we focuse on the correlation of our results to the density of samples. This should give quantitative structural information which could be correlated to both macroscopic properties and elaboration conditions.
- Type
- Research Article
- Information
- Copyright
- Copyright © Materials Research Society 1999