Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-25T18:04:38.635Z Has data issue: false hasContentIssue false

Very Low Loss Ceramic Dielectric Resonator Materials

Published online by Cambridge University Press:  10 February 2011

N McN Alford
Affiliation:
South Bank University, 103 Borough Road, London SEI 0AA, UK, [email protected]
S J Penn
Affiliation:
South Bank University, 103 Borough Road, London SEI 0AA, UK, [email protected]
A Templeton
Affiliation:
South Bank University, 103 Borough Road, London SEI 0AA, UK, [email protected]
X Wang
Affiliation:
South Bank University, 103 Borough Road, London SEI 0AA, UK, [email protected]
P Filhol
Affiliation:
Tekelec Components, Pessac, France
N Klein
Affiliation:
Forschungszentrum Mich GmbH, postfach 1913, D-5170 Germany
C. Zuccaro
Affiliation:
Forschungszentrum Mich GmbH, postfach 1913, D-5170 Germany
J C Gallop
Affiliation:
National Physical Laboratory, Teddington, UK
Get access

Abstract

The huge increase in the use of microwave communications places severe constraints on the operating performance of the microwave filters. Dielectric resonators are a very attractive option as they can be prepared with very low dielectric loss, moderately high dielectric constant and a low temperature coefficient of the resonant frequency. In filters they possess very low intermodulation products and are capable of handling high power. Certain dielectric oxide single crystals display very low loss at microwave frequencies and on cooling the loss is generally observed to drop. The Q of sapphire at 10 GHz exceeds 107 at low temperatures of around 10K. However, single crystals are expensive and the purpose of this research is to explore inexpensive, sintered polycrystalline alternatives. By very careful attention to purity, processing and microstructure Q values approaching those of single crystals have been achieved. The loss of polycrystalline ceramics of Al2O3, Ba(Mg1/3Ta2/3)O3 (BMT) and Zr0.875Sn0.25Ti0.875O4 (ZTS) has been studied. Alumina, Al2O3 has been studied as a model material for dielectric loss. Theory predicts that the loss in single crystal sapphire should follow a T5 dependence. However at low temperatures the loss is dominated by extrinsic losses due to crystal imperfection, residual dopant atoms, dislocations and other lattice defects and the T5 dependence does not hold. In polycrystalline alumina the intrinsic loss is immediately masked by these extrinsic losses, even at room temperature, and a simple T dependence is observed. Results on polycrystalline alumina show that a Q of > 5×104 at 10 GHz and at room temperature are possible and Q's well in excess of 105 at 10 GHz and 77 K can be achieved.

Type
Research Article
Copyright
Copyright © Materials Research Society 1998

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Kajfez, D. and Guillon, P., Dielectric Resonators, (Artech House, Zurich, 1986)Google Scholar
2. Alford, N McN and Penn, S J, “Sintered alumina with low dielectric loss”, J. Appl. Phys., 80 p. 58955898 (1996)Google Scholar
3. Penn, S., Alford, N. McN., Templeton, A., Xu, M., Wang, X., Reece, M. and Schrapel, K., “Effect of Porosity and Grain Size on the Dielectric Properties of Sintered Alumina”, J. Am. Ceram. Soc. 80 p. 18851888 (1997)Google Scholar
4. Braginsky, V. B., Ilchenko, V. S. and Bagdassarov, K. S.. Physics Letters A 120 p 300305 (1987)Google Scholar
5. Alford, N. McN., Button, T. W., Adams, M. J., Hedges, S., Nicholson, B. and Philips, W. A.. “Low Surface Resistance YBa2Cu3Ox Melt-Processed Thick FilmsNature 349 p. 680683, (1991)Google Scholar
6. Alford, N. McN., Penn, SJ, Templeton, A and Wang, XLow loss sintered dielectric resonators with HTS thick filmsJ Supercond 10 (5) 467472 (1997)Google Scholar