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Valence Band Electronic Structure of Cleaved Iron Oxide Single Crystals Studied by Resonant Photoemission

Published online by Cambridge University Press:  21 February 2011

Robert J. Lad
Affiliation:
Applied Physics, Yale University, 15 Prospect Street, New Haven, CT 06520
Victor E. Henrich
Affiliation:
Applied Physics, Yale University, 15 Prospect Street, New Haven, CT 06520
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Abstract

Synchrotron radiation has been used to perform resonant photoemission measurements across the 3p→3d photoabsorption threshold from cleaved FexO (x ≃0.945), Fe3O4, and α-Fe2O3 single crystal surfaces. The resonant enhancement of the Fe 3d photoelectrons allows the Fe 3d-derived final states in the valence band to be distinguished from the overlapping O 2p states. Using well-characterized single crystals, the distributions of Fe 3d-derived states associated with the ferrous (Fe2+) and ferric (Fe3+) cations have been identified. The Fe 3d-derived states are found to extend about 18 eV below the Fermi level in each oxide, which can be attributed to a significant amount of hybridization between the Fe 3d and O 2p orbitals.

Type
Research Article
Copyright
Copyright © Materials Research Society 1989

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References

[1] Eastman, D.E. and Freeouf, J.L., Phys. Rev. Lett. 34, 395 (1975).CrossRefGoogle Scholar
[2] Alvarado, S.F., Erbudak, M., and Munz, P., Phys. Rev. B 14, 2740 (1976).CrossRefGoogle Scholar
[3] Brundle, C.R., Chuang, T.J., and Wandelt, K., Surface Sci. 68, 459 (1977).CrossRefGoogle Scholar
[4] McIntyre, N.S. and Zetaruk, D.G., Anal. Chem. 49, 1521 (1977).CrossRefGoogle Scholar
[5] Bagus, P.S., Brundle, C.R., Chuang, T.J., and Wandelt, K., Phys. Rev. Lett. 39, 1229 (1977).CrossRefGoogle Scholar
[6] Grenet, G., Jugnet, Y., Duc, T.M., and Kibler, M., J. Chem. Phys. 72, 218 (1980); G. Grenet, Y. Jugnet, T.M. Duc, and M. Kibler, J. Chem. Phys. 74, 2163 (1981).CrossRefGoogle Scholar
[7] Fujimori, A., Minami, F., and Sugano, S., Phys. Rev. B 29, 5225 (1984); A. Fujimori and F. Minami, Phys. Rev., 30, 957 (1984).CrossRefGoogle Scholar
[8] Fujimori, A., Saeki, M., Kimizuka, N., Taniguchi, M., and Suga, S., Phys. Rev. B34, 7318 (1986).CrossRefGoogle Scholar
[9] Zaanen, J., Sawatzky, G.A., and Allen, J.W., Phys. Rev. Lett. 55, 418 (1985); J. Magn. Mat. 54–57, 607 (1986).CrossRefGoogle Scholar
[10] Lad, R.J. and Henrich, V.E., Phys. Rev. B (to be published).Google Scholar
[11] Davis, L.C., J. Appl. Phys., 59, R25 (1986).CrossRefGoogle Scholar
[12] Fujimori, A., Kimizuka, N., Taniguchi, M., and Suga, S., Phys. Rev. B 36, 6691 (1987).CrossRefGoogle Scholar
[13] Lad, R.J. and Henrich, V.E., J. Vac. Sci. Technol. A (to be published).Google Scholar