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Vacancy Supersaturation Model for Electromigration Failure Under DC and Pulsed DC Stress
Published online by Cambridge University Press: 15 February 2011
Abstract
Time-dependent vacancy concentration profiles are calculated numerically as solutions to the electromigration transport equation under dc and pulsed dc current stress conditions in finite-length conductors. An electromigration model based on the buildup of a critical vacancy supersaturation to initiate failure agrees well with several reported experimental observations.
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- Copyright © Materials Research Society 1992
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