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Use of Multi-Walled Carbon Nanotubes for Conductive Probe Scanning Force Microscopy (Cp-SFM)

Published online by Cambridge University Press:  15 March 2011

Kevin B. Stavens  and
Ronald P. Andres
Kevin B. Stavens
Affiliation:
School of Chemical Engineering, Purdue University, W. Lafayette, IN 47907-1283, U.S.A.
Ronald P. Andres
Affiliation:
School of Chemical Engineering, Purdue University, W. Lafayette, IN 47907-1283, U.S.A.
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Abstract

Multi-Walled Carbon Nanotubes (MWNTs) mounted on commercial Scanning Force Microscopy (SFM) cantilevers have proven to be excellent probes for high resolution Tapping Mode-Scanning Force Microscopy (TM-SFM). Because of their robust nature and high electrical conductance, MWNTs are also attractive for use in Conductive Probe-Scanning Force Microscopy (CP-SFM). To be used in this application, however, the MWNT must be mounted via a high conductance contact to a conductive cantilever. A technique has been developed that produces such a contact. First, a MWNT is attached using acrylic adhesive to a commercial SFM cantilever that has been vacuum coated with gold. Then, a cap of gold is deposited over the junction between the MWNT and the SFM cantilever via spatially selective electro-deposition.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 633: Symposium A – Nanotubes and Related Materials , 2000 , A8.6
Copyright
Copyright © Materials Research Society 2001

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