Hostname: page-component-586b7cd67f-dsjbd Total loading time: 0 Render date: 2024-11-25T18:28:08.175Z Has data issue: false hasContentIssue false
  • English
  • Français

Unstable Plane in Bi-Sr-Ca-Cu-O System by TGA

Published online by Cambridge University Press:  26 February 2011

H. Zhang ,
Q.R. Feng ,
S. Q. Feng ,
X. Zhu  and
Z. Z. Gan
H. Zhang
Affiliation:
Department of Physics, Peking University, Beijing 100871, China
Q.R. Feng
Affiliation:
Department of Physics, Peking University, Beijing 100871, China
S. Q. Feng
Affiliation:
Department of Physics, Peking University, Beijing 100871, China
X. Zhu
Affiliation:
Department of Physics, Peking University, Beijing 100871, China
Z. Z. Gan
Affiliation:
Department of Physics, Peking University, Beijing 100871, China
Get access

Abstract

By thermogravimetry analysis (TGA), x-ray diffraction and R(T) relationship determination, the BiSrCaCuO system superconductors with composition of 2201, 2212 and 2223 were studied systematically. The experiments discovered that there is an unstable plane in 2223 sample, but not in 2201 and 2212. Comparing this result with the structure and property of 123 phase in YBCO-system, analyzing carefully, we found that only those superconductors which have the unstable plane are of higher Tc value. The role of the unstable plane in a superconductor is discussed. It is possible that 110K superconductivity in Bi-system has a close relationship with the existence of this unstable plane.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 209: Symposium K – Defects in Materials , 1990 , 901
Copyright
Copyright © Materials Research Society 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Maeda, A., Hase, M., Tsukada, I., Noda, K., Takehayashi, S., and Uchinokura, K., Phys.Rev. B41(1990),6418.Google Scholar
2. Ramesh, R., Bagley, B.G., and Tarascon, J.M., J.Appl.Phys. 67(1990),379.Google Scholar
3. Hermann, F., Kasowski, R.V., Hsu, W.Y., Pyhs.Rev. B38(1988),204.Google Scholar
4. Mathesis, L.F., and Hamann, D.R., Phys.Rev. B38(1988),5012.Google Scholar
5. Kambe, S.,Matsuoka, T., Takahasi, M., Kawai, M., and Kawai, T., Phys. Rev. B42(1990), 2669.Google Scholar
6. Feng, Q.R., Zhang, H., Feng, S.Q., Zhu, X., and Gan, Z.Z., Solid State Comm.(to be published).Google Scholar
7. Tarascon, J.M., Barboux, P., Miceli, P.F., Green, L.H., Hull, G.W., Eibschutz, M., and Sunshine, S.A., Phys. Rev. B37(1988),7458.Google Scholar
8. Zhao, J., Wu, M., Abdul-Razzaq, W., Seehra, M.S., Physica C165(1990),135.Google Scholar
9. Tranquada, J.M., Heald, S.M., Moodenbaugh, A.R., and Xu, Y., Phys.Rev. B38(1988), 8893.CrossRefGoogle Scholar
10. Bokhimi, A., Garcia-ruiz, A., Perez, L., Orozoo, E., Asomoza, R., and Asomoza, M., Physica C159(1989),654.Google Scholar