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Unimportance of Siloxene in Luminescent Porous Silicon as Determined by Nexafs & Exafs
Published online by Cambridge University Press: 25 February 2011
Abstract
Near-edge-- and extended--x-ray absorption fine structure measurements, as well as luminescence excitation and emission spectra, were obtained from samples of porous Si and siloxene. Contrary to a recently proposed explanation for the room temperature luminescence in porous Si, the combined data indicate that siloxene is not principally responsible for the observed effect.
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- Copyright © Materials Research Society 1993
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