Hostname: page-component-cd9895bd7-gvvz8 Total loading time: 0 Render date: 2024-12-27T02:35:03.817Z Has data issue: false hasContentIssue false

Tunneling Spectroscopy of short atomic chains.

Published online by Cambridge University Press:  11 February 2011

Jeremy Stein
Affiliation:
Yeshiva University, Department of Physics, 2495 Amsterdam Ave., New York, NY, USA
Fredy R. Zypman
Affiliation:
Yeshiva University, Department of Physics, 2495 Amsterdam Ave., New York, NY, USA
Get access

Abstract

In this paper we present results on transmission-energy and current-voltage curves for a Scanning Tunneling Microscopy probe in the presence of an atomic chain, operating in spectroscopy mode. We compare the results with independently calculated density of sates. Finally, we propose algorithms to process this experimental information to obtain chemical specificity and position of impurities in the chain.

Type
Research Article
Copyright
Copyright © Materials Research Society 2003

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Rubio-Bollinger, G., Bahn, S.R., Agrait, N., Jacobsen, K.W., and Vieira, S., Phys. Rev. Lett. 87, 026101 (2001)Google Scholar
2 Stein, Jeremy, Zypman, Fredy, “Spectroscopy of atomic chains with tunneling microscopy”, to appear in UltramicroscopyGoogle Scholar
3 Tersoff, J., Hamann, D.R., Phys. Rev. B31, 805 (1985)Google Scholar
4 Lang, N.D., Phys. Rev. Lett. 55, 230 (1985)Google Scholar
5 Lang, N.D., Phys. Rev. Let. 55, 2925 (1985)Google Scholar
6 Chen, C. J., J. Vac. Sci. Technol. A6, 319 (1988)Google Scholar
7 Leavens, C.R., Aers, G.C., Phys. Rev. B38, 7357 (1988)Google Scholar
8 Tekman, E., Ciraci, S., Phys. Rev. B40, 10286 (1989)Google Scholar
9 Ciraci, S., Tekman, E., Phys. Rev. B40, 11969 (1989)Google Scholar
10 Chen, C. J., Phys. Rev. Lett. 65, 448 (1990)Google Scholar
11 Doyen, G., Drakova, D., Scheffler, M., Phys. Rev. B47, 9778 (1993)Google Scholar
12 Feenstra, R.M., J. Vac. Sci. Technol. B7, 925 (1989)Google Scholar
13 Avouris, P., Lyo, I., Surf. Sci. 242, 1 (1991)Google Scholar
14 Hamers, R.J., Tromp, R.M., Demuth, J.E., Phys. Rev. Lett. 56, 1972 (1986).Google Scholar
15 Hess, H.F., Robinson, R.B., Dynes, R.C., Valles, J.M. Jr, Waszczak, J.V., J. Vac. Sci. Technol. A8, 450 (1990)Google Scholar
16 Davis, L.C., Everson, M.P., Jaklevic, R.C., Shen, W., Phys. Rev. B43, 3821 (1991)Google Scholar
17 Stroscio, J.A., Feenstra, R.M., Fein, A.P., Phys. Rev. Lett. 57, 2579 (1986)Google Scholar
18 Feenstra, R.M., Stroscio, J.A., Fein, A.P., Surf. Sci. 181, 295 (1987)Google Scholar
19 Lang, N.D., Phys. Rev. B34, 5947 (1986)Google Scholar
20 Selloni, A., Carnevalli, P., Tosati, E., Chen, C.D., Phys. Rev. B31, 2602 (1985)Google Scholar
21 Tsukada, M., Kobayashi, K., Isshiki, N., Kageshima, H., Surf. Sci. Reports 13, 2 (1991)Google Scholar
22 Zypman, F.R., Fonseca, L.F., Goldstein, Y., Phys. Rev. B49, 1981 (1994);Google Scholar
Zypman, F.R., Fonseca, L.F., Phys. Rev. B51, 2501 (1995);Google Scholar
Zypman, Fredy R, Fonseca, Luis, Phys Rev B55, 15012 (1997)Google Scholar
23 Tromp, R., J. Phys. Condens. Matt. 1 10211 (1989)Google Scholar
24 Hamers, R.J. in Scanning Tunneling Microscopy I, edited by Güntherodt, H. J. and Wiesendanger, R., Springer Series in Surface Sciences 20 (1992)Google Scholar
25 Hamers, R.J., Annu. Rev. Phys. Chem. 40, 531 (1989)Google Scholar