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Tungsten Film Formation on Silicon by Combining Ionic Decomposition of Metal Halides with Rapid Thermal Processing
Published online by Cambridge University Press: 25 February 2011
Abstract
Thin films of tungsten metal and tungsten silicide were formed by combination of spin-on of tungsten chloride dissolved in a volatile organic solvent, decomposition of the chloride by ion bombardment and finally heating in a new versatile Rapid Thermal Processing (RTP) system. The films resulting from this treatment were characterized by Rutherford Backscattering Spectrometry (RBS) prior to and after the ionic decomposition and heat treatment. The procedure and the results of the analysis are described and discussed in terms of process conditions in this paper.
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