Hostname: page-component-cd9895bd7-hc48f Total loading time: 0 Render date: 2024-12-27T02:37:41.739Z Has data issue: false hasContentIssue false

Transition Metal-Doped ZnO: A Comparison of Optical, Magnetic, and Structural Behavior of Bulk and Thin Films

Published online by Cambridge University Press:  01 February 2011

William E. Fenwick
Affiliation:
[email protected], Georgia Institute of Technology, Electrical and Computer Engineering, 778 Atlantic Dr., Atlanta, GA, 30332-0250, United States
Matthew H. Kane
Affiliation:
[email protected], Georgia Institute of Technology, School of Electrical and Computer Engineering, 778 Atlantic Dr., Atlanta, GA, 30332-0250, United States
Zaili Fang
Affiliation:
[email protected], Georgia Institute of Technology, School of Electrical and Computer Engineering, 778 Atlantic Dr., Atlanta, GA, 30332-0250, United States
Tahir Zaidi
Affiliation:
[email protected], Georgia Institute of Technology, School of Electrical and Computer Engineering, 778 Atlantic Dr., Atlanta, GA, 30332-0250, United States
Nola Li
Affiliation:
[email protected], Georgia Institute of Technology, School of Electrical and Computer Engineering, 778 Atlantic Dr., Atlanta, GA, 30332-0250, United States
Varatharajan Rengarajan
Affiliation:
[email protected], Cermet, Inc., 1019 Collier Rd., Atlanta, GA, 30318, United States
Jeff Nause
Affiliation:
[email protected], Cermet, Inc., 1019 Collier Rd., Atlanta, GA, 30318, United States
Ian T. Ferguson
Affiliation:
[email protected], Georgia Institute of Technology, School of Electrical and Computer Engineering, 778 Atlantic Dr., Atlanta, GA, 30332-0250, United States
Get access

Abstract

Transition metal-doped ZnO bulk crystals and thin films have been investigated to determine the effects of transition metal incorporation on optical, magnetic, and structural properties of ZnO. A modified melt growth technique was used to grow bulk Zn1-xMnxO, Zn1-xCoxO, and Zn1-xFexO. Optical transmission measurements show an apparent shift in absorption edge with increasing transition metal incorporation. Raman spectroscopy also shows increasing lattice disorder with increasing transition metal concentration. ZnO thin films doped with Ni, Co, and Gd were grown by metalorganic chemical vapor deposition (MOCVD). While the Co-doped thin films showed antiferromagnetic behavior, magnetic hysteresis was observed in the Ni-doped and Gd-doped thin films. Structural quality was verified with X-ray diffraction (XRD), and optical properties were investigated using room temperature photoluminescence (PL) and optical transmission measurements. Properties of ZnO:TM bulk crystals and thin films are compared and used to discuss possible origins of ferromagnetism in these materials.

Type
Research Article
Copyright
Copyright © Materials Research Society 2007

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Dietl, T., Ohno, H., Matsukura, F., Cibert, J., and Ferrand, D., Science 287 (2000) 1019.Google Scholar
[2] Sato, K. and Katayama-Yoshida, H., Semiconductor Science & Technology 17 (2002) 367.Google Scholar
[3] Zunger, A., Electronic Structure of 3d Transition=Atom Impurities in Semiconductors, in Solid State Physics, Ehrenreich, H. and Turnbull, D., Editors. 1986, Academic Press: New York. p. 275.Google Scholar
[4] Prellier, W., Fouchet, A., Simon, Ch., Mercey, B., Materials Science and Engineering B 109 (2004) 192.Google Scholar
[5] Heo, Y. W., Varadarajan, V., Kaufman, M., Kim, K., Norton, D. P., Ren, F., and Fleming, P.H., Applied Physics Letters. 81, 3046 (2002)Google Scholar
[6] Zhang, Y., Du, G., Zhu, H., Hou, C., Huang, K. and Yang, S., Optical Materials, 27 (2004), p. 399.Google Scholar
[7] Coey, J.M.D., Venkatesan, M., and Fitzgerald, C.B., Nature Materials, 2005. 4: p. 173179.Google Scholar
[8] Toyoda, M., Akai, H., Sato, K., and Katayama-Yoshida, H., Physica, B 376–377 (2006) p. 647650.Google Scholar
[9] Reynolds, D. C., Litton, C. W., et al., J. Appl. Physics 95 (2004) 4802.Google Scholar
[10] Potzger, Zhou, S., Eichhorn, F., Helm, M., Skorupa, W., Mucklich, A., Fossbender, J., Hermannsdorfer, T., and Bianchi, A., Journ. Appl. Phys. 99 063906 (2006).Google Scholar
[11] Calleja, J. M. and Cardona, M., Phys. Rev B 16 (1977) 3753.Google Scholar
[12] Manjon, F. J., Mari, B., et al., J. Appl. Phys. 97 (2005) 053516.Google Scholar