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Thickness Dependencies in the Calculated Properties of Metallic Ultra-Thin Films
Published online by Cambridge University Press: 10 February 2011
Abstract
Ultra-thin film (UTF) electronic structure calculations are a common tool for investigating surface properties. In this work, electronic structure calculations for A1(111) films ranging from one to twelve atoms thick are used to illustrate some of the difficulties that can arise when one attempts to determine surface properties of metals with UTF calculations.
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- Copyright © Materials Research Society 1998
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