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Thickness Dependence of Transport Properties of Epitaxial SrRuO3 Thin Films Grown on SrTiO3 Substrates

Published online by Cambridge University Press:  17 March 2011

G. Herranz ,
F. Sánchez ,
M.V. García-Cuenca ,
C. Ferrater ,
M. Varela ,
B. Martínez  and
J. Fontcuberta
G. Herranz
Affiliation:
Institut de Ciència de Materials de Barcelona – CSIC. Campus UAB, Bellaterra 08193., SPAIN
F. Sánchez
Affiliation:
Institut de Ciència de Materials de Barcelona – CSIC. Campus UAB, Bellaterra 08193., SPAIN
M.V. García-Cuenca
Affiliation:
Institut de Ciència de Materials de Barcelona – CSIC. Campus UAB, Bellaterra 08193., SPAIN
C. Ferrater
Affiliation:
Institut de Ciència de Materials de Barcelona – CSIC. Campus UAB, Bellaterra 08193., SPAIN
M. Varela
Affiliation:
Institut de Ciència de Materials de Barcelona – CSIC. Campus UAB, Bellaterra 08193., SPAIN
B. Martínez
Affiliation:
Dept. de Física Aplicada i Òptica, Universitat de Barcelona, Avda. Diagonal 647, Barcelona 08028., SPAIN
J. Fontcuberta
Affiliation:
Dept. de Física Aplicada i Òptica, Universitat de Barcelona, Avda. Diagonal 647, Barcelona 08028., SPAIN
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Abstract

To study the effect of the film/substrate interface in thin films we have analyzed the thickness dependence of the transport properties of SrRuO3 films grown on SrTiO3 substrates. Our data makes evident the failure of the so-called deadlayer model to describe the observed thickness dependence of the conductivity. This is interpreted as due to a non-monotonous change of microstructure as thickness increases. Indeed, Atomic Force Microscopy studies indicate substantial modifications of the growth mechanism with thickness.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 690: Symposium F – Spintronics , 2001 , F3.5
Copyright
Copyright © Materials Research Society 2002

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References

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