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Thermionic FEEM, PEEM and I/V Measurements of N-Doped CVD Diamond Surfaces

Published online by Cambridge University Press:  14 March 2011

F.A.M. Köck ,
J.M. Garguilo ,
B. Brown  and
R.J. Nemanich
F.A.M. Köck
Affiliation:
Department of Physics North Carolina State University Raleigh, NC 27695-8202, USA
J.M. Garguilo
Affiliation:
Department of Physics North Carolina State University Raleigh, NC 27695-8202, USA
B. Brown
Affiliation:
Department of Physics North Carolina State University Raleigh, NC 27695-8202, USA
R.J. Nemanich
Affiliation:
Department of Physics North Carolina State University Raleigh, NC 27695-8202, USA
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Abstract

Imaging of field emission and photoemission from diamond surfaces is accomplished with a high resolution photo-electron emission microscope (PEEM). Measurements obtained as a function of sample temperature up to 1000°C display thermionic field emission images (TFEEM). The system can also record the emission current versus applied voltage. N-doped diamond films have been produced by MPCVD with a N/C gas phase ratio of 48. The surfaces display uniform emission in PEEM at all temperatures. No FEEM images are detectable below 500°C. At ∼680°C the T-FEEM and PEEM images are nearly identical in intensity and uniformity. This is to be contrasted with other carbon based cold cathodes in which the emission is observed from only a low density of highly emitting sites. The I/V measurements obtained from the N-doped films in the T-FEEM configuration show a component that depends linearly on voltage at low fields. At higher fields, an approximately exponential dependence is observed. At low temperatures employed (<700°C), the results indicate a thermionic component to the emitted current.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 621: Symposia Q/R – Electron-Emissive Materials, Vacuum Microelectronics… , 2000 , R6.5.1
Copyright
Copyright © Materials Research Society 2000

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References

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