Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Look, D.C
1997.
Electrical transport properties of III-nitrides.
Materials Science and Engineering: B,
Vol. 50,
Issue. 1-3,
p.
50.
Van de Walle, Chris G
Stampfl, Catherine
and
Neugebauer, Jörg
1998.
Theory of doping and defects in III–V nitrides.
Journal of Crystal Growth,
Vol. 189-190,
Issue. ,
p.
505.
Orton, J W
and
Foxon, C T
1998.
Group III nitride semiconductors for short wavelength light-emitting devices.
Reports on Progress in Physics,
Vol. 61,
Issue. 1,
p.
1.
Pelzmann, Arthur
Kirchner, Christoph
Mayer, Markus
Schwegler, Veit
Schauler, Markus
Kamp, Markus
Joachim Ebeling, Karl
Grzegory, Izabella
Leszczynski, Michal
Nowak, Grzegorz
and
Porowski, Sylvester
1998.
Blue light-emitting diodes on GaN substrates, growth and characterization.
Journal of Crystal Growth,
Vol. 189-190,
Issue. ,
p.
167.
Neugebauer, Jörg
and
Van De Walle, Chris G.
1999.
Vol. 61,
Issue. ,
p.
479.
Emtsev, V.V
Davydov, V.Yu
Lundin, V.V
Poloskin, D.S
Aderhold, J
Klausing, H
Mistele, D
Rotter, T
Stemmer, J
Fedler, F
Semchinova, O
and
Graul, J
2000.
Annealing behaviour of electrically active point defects in gamma-irradiated n-GaN films.
Journal of Crystal Growth,
Vol. 210,
Issue. 1-3,
p.
273.
Torvik, John T.
2000.
III-Nitride Semiconductors: Electrical, Structural and Defects Properties.
p.
17.
Kirchner, C.
Schwegler, V.
Eberhard, F.
Kamp, M.
Ebeling, K.J.
Prystawko, P.
Leszczynski, M.
Grzegory, I.
and
Porowski, S.
2000.
MOVPE homoepitaxy of high-quality GaN: Crystal growth and devices.
Progress in Crystal Growth and Characterization of Materials,
Vol. 41,
Issue. 1-4,
p.
57.
Hansen, M.
Chen, L.F.
Speck, J.S.
and
DenBaars, S.P.
2001.
Observation of Mg-Rich Precipitates in the p-Type Doping of GaN-Based Laser Diodes.
physica status solidi (b),
Vol. 228,
Issue. 2,
p.
353.
Collado, C.
Goglio, G.
Demazeau, G.
Barrière, A.S.
Hirsch, L.
and
Leroux, M.
2002.
Photoluminescence of GaN microcrystallites prepared by a new solvothermal process.
Materials Research Bulletin,
Vol. 37,
Issue. 5,
p.
841.
2002.
Physics of Quantum Well Devices.
Vol. 7,
Issue. ,
p.
223.
Kim, Dong Hyuk
Lee, Go Eun
Yoon, Euijoon
Park, Do‐Young
Cheong, Hyeonsik
Choi, Woo Seok
Noh, Tae Won
Cho, Jin‐Hyoung
and
Park, Joong‐Seo
2009.
Effect of dimethylhydrazine on p‐type conductivity of as‐grown Mg‐doped GaN.
physica status solidi (RRL) – Rapid Research Letters,
Vol. 3,
Issue. 2-3,
p.
52.
Liliental-Weber, Zuzanna
2014.
Structural defects in GaN revealed by transmission electron microscopy.
Japanese Journal of Applied Physics,
Vol. 53,
Issue. 10,
p.
100205.
Kumar, Ashutosh
Uzuhashi, Jun
Ohkubo, Tadakatsu
Tanaka, Ryo
Takashima, Shinya
Edo, Masaharu
and
Hono, Kazuhiro
2019.
Atomic-scale quantitative analysis of implanted Mg in annealed GaN layers on free-standing GaN substrates.
Journal of Applied Physics,
Vol. 126,
Issue. 23,
Goyal, Anshu
Yadav, Brajesh S.
Raman, R.
Kumar, Anand
Dalal, Sandeep
Tyagi, Renu
Kumar, Vikram
and
Kapoor, Ashok K.
2021.
Non Destructive Evaluation of AlGaN/GaN HEMT structure by cathodoluminescence spectroscopy.
Journal of Luminescence,
Vol. 232,
Issue. ,
p.
117834.